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Modeling of Impact Ionization and Charge Trapping in SuperCDMS HVeV Detectors

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Abstract

A model for charge trapping and impact ionization and an experiment to measure these parameters are presented for the SuperCDMS HVeV detector. A procedure to isolate and quantify the main sources of noise (bulk and surface charge leakage) in the measurements is also described. This sets the stage to precisely measure the charge trapping and impact ionization probabilities in order to incorporate this model into future dark matter searches.

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Acknowledgements

This work was supported in part by the US Department of Energy and by the National Science Foundation. This document was prepared by using resources of the Fermi National Accelerator Laboratory (Fermilab), a US Department of Energy, Office of Science, HEP User Facility. Fermilab is managed by Fermi Research Alliance, LLC (FRA), acting under Contract No. DE-AC02-07CH11359. SLAC is operated under Contract No. DEAC02-76SF00515 with the US Department of Energy. The authors are also especially grateful to the staff of the Varian Machine Shop at Stanford University for their assistance in machining the parts used in this experiment.

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Authors and Affiliations

  1. Department of Physics, Stanford University, Stanford, CA, 94305, USA

    F. Ponce, B. Cabrera, C. Stanford & S. Yellin

  2. Department of Physics, University of California, Berkeley, Berkeley, CA, 94720, USA

    W. Page, C. Fink, M. Pyle, B. Sadoulet, B. Serfass & S. Watkins

  3. SLAC National Accelerator Laboratory/KIPAC, Menlo Park, CA, 94025, USA

    P. L. Brink, B. Cabrera, M. Cherry & R. Partridge

  4. Fermi National Accelerator Laboratory, Batavia, IL, 60510, USA

    N. Kurinsky

  5. Department of Physics, Santa Clara University, Santa Clara, CA, 95053, USA

    B. A. Young

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  1. F. Ponce
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  2. W. Page
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  3. P. L. Brink
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  4. B. Cabrera
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  6. C. Fink
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  8. R. Partridge
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  9. M. Pyle
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  12. C. Stanford
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  14. S. Yellin
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  15. B. A. Young
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Corresponding author

Correspondence to F. Ponce.

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Ponce, F., Page, W., Brink, P.L. et al. Modeling of Impact Ionization and Charge Trapping in SuperCDMS HVeV Detectors. J Low Temp Phys 199, 598–605 (2020). https://doi.org/10.1007/s10909-020-02349-x

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  • DOI: https://doi.org/10.1007/s10909-020-02349-x

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