Comparison of Critical Current Scaling Behaviors in $\hbox {MgB}_{2}$/SiC/Si Thin Films

Abstract

Scaling behaviors of critical current density $J_{c}$ in $\hbox {MgB}_{2}$ thin films are investigated on different films with thickness of 100 nm, in comparison with 50- and 10-nm films based on a comprehensive scaling formula. Experimental data are reduced and analyzed with the formula over a wide range of magnitudes. In 100- and 50-nm films the single scaling function has been able to fit experimental $J_{c}$ data up to ten orders of magnitudes with appropriate flux pinning parameters. On the other hand, for the 10-nm film, different $J_{c}$ dependences were found on temperature and magnetic field, concerning anomalous or granular superconductivity.