Abstract
We report on the measurements of electrons trapped in solid molecular films of H\(_{2}\), HD, and D\(_{2}\). A narrow ESR line associated with the trapped electrons was detected with \(g=2.00233(5)\), which turned out to be shifted by \(-\)0.3 G from the free electron resonance. Comparison is made with earlier measurements where a similar line has been seen. In addition, for a \(\text {D}_{2}{:}\text {H}_{2}\) mixture, after raising the temperature above 1 K, we observe a strong line at the location of the electron cyclotron resonance. The line amplitude is dependent on temperature and has an activation energy of 26 K. We believe that at elevated temperatures, electrons diffuse from the bulk of the film to the surface.
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Notes
Due to different magnetic fields of 0.3 and 4.6 T, relative positions of the central D in D\(_{2}\) line and electron line are different in these experiments.
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Acknowledgments
We acknowledge the funding from the Wihuri Foundation and the Finnish academy Grants Nos. 258074, 260531, and 268745. This work is also supported by NSF Grant No. DMR 1209255. S.S. thanks UTUGS for support.
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Sheludiakov, S., Ahokas, J., Järvinen, J. et al. Electron Spin Resonance Study of Electrons Trapped in Solid Molecular Hydrogen Films. J Low Temp Phys 183, 120–126 (2016). https://doi.org/10.1007/s10909-015-1378-7
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DOI: https://doi.org/10.1007/s10909-015-1378-7