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Energy Resolution of STJ X-Ray Detectors with Killed Electrode. Simple Model

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Abstract

Superconducting tunnel junctions X-ray detectors Ti/Nb/Al,AlO x /Al/Nb(2)/NbN with killed Ti/Nb electrode was studied as a function of bias voltage, energy of the absorbed quantum, and thickness of the Nb(2) layer. The data was compared with a simple diffusion model including the losses of excess quasiparticles due to self-recombination. It was shown that increasing of the electrode thickness reduces the self-recombination contribution and improves the linearity of the detector response.

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Acknowledgements

This study was supported by the Ministry of Education and Science of the Russian Federation (Contract No. 02.740.11.0242).

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Authors and Affiliations

  1. Skobeltsyn Institute of Nuclear Physics, Lomonosov Moscow State University, 119991, Moscow, Russian Federation

    V. A. Andrianov

  2. Institute of Radio Engineering and Electronics RAS, 103907, Moscow, Russian Federation

    L. V. Filippenko

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  1. V. A. Andrianov
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  2. L. V. Filippenko
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Correspondence to V. A. Andrianov.

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Andrianov, V.A., Filippenko, L.V. Energy Resolution of STJ X-Ray Detectors with Killed Electrode. Simple Model. J Low Temp Phys 167, 404–409 (2012). https://doi.org/10.1007/s10909-012-0525-7

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  • DOI: https://doi.org/10.1007/s10909-012-0525-7

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