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Electrical Noise in a TES as a Resistively Shunted Conducting Junction

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Abstract

We present results of the analysis of electrical noise in a transition edge sensor (TES) as a resistively shunted conducting junction (the RSJ model). We derive an expression for the spectral density of voltage fluctuations taking into account weak superconductivity of a TES. We analyse and discuss differences in voltage noise in a TES compared to the familiar situation for the Josephson junction. The spectral density of voltage noise in the RSJ model has a unique analytical structure and cannot be reduced to the expression for the nonlinear Johnson noise near equilibrium.

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Authors and Affiliations

  1. Department of Physics, Lancaster University, Lancaster, LA1 4ER, UK

    A. Kozorezov & J. K. Wigmore

  2. Faculty of Science and Technology and MESA+ Institute for Nanotechnology, University of Twente, Enschede, The Netherlands

    A. A. Golubov

  3. Advanced Studies and Technology Preparation Division, Scientific Projects Department, European Space Agency ESTEC, Postbus 299, 2200 AG, Noordwijk, The Netherlands

    D. D. E. Martin

  4. SRON National Institute for Space Research, Sorbonnelaan 2, Utrecht, 3584, CA, The Netherlands

    P. A. J. de Korte, M. A. Lindeman, R. A. Hijmering, J. van der Kuur, H. F. C. Hoevers & L. Gottardi

  5. Nuclear Physics Institute, Moscow State University, 119992, Moscow, Russia

    M. Y. Kupriyanov

Authors
  1. A. Kozorezov
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  2. A. A. Golubov
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  3. D. D. E. Martin
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  4. P. A. J. de Korte
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  5. M. A. Lindeman
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  6. R. A. Hijmering
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  7. J. van der Kuur
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  8. H. F. C. Hoevers
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  9. L. Gottardi
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  10. M. Y. Kupriyanov
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  11. J. K. Wigmore
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Corresponding author

Correspondence to A. Kozorezov.

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Kozorezov, A., Golubov, A.A., Martin, D.D.E. et al. Electrical Noise in a TES as a Resistively Shunted Conducting Junction. J Low Temp Phys 167, 108–113 (2012). https://doi.org/10.1007/s10909-012-0489-7

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  • DOI: https://doi.org/10.1007/s10909-012-0489-7

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