Abstract
The so-called excess noise limits the energy resolution of transition-edge sensor (TES) detectors, and its physical origin has been unclear, with many competing models proposed. Here we present the noise and impedance data analysis of a rectangular X-ray Ti/Au TES fabricated at SRON. To account for all the major features in the impedance and noise data simultaneously, we have used a thermal model consisting of three blocks of heat capacities, whereas a two-block model is clearly insufficient. The implication is that, for these detectors, the excess noise is simply thermal fluctuation noise of the internal parts of the device. Equations for the impedance and noise for a three-block model are also given.
Similar content being viewed by others
References
K. Irwin, G. Hilton, in Cryogenic Particle Detection, ed. by Ch. Enss (Springer, Berlin, 2005), p. 63
J.N. Ullom et al., Appl. Phys. Lett. 84, 4206 (2004)
K.M. Kinnunen, A.K. Nuottajärvi, J. Leppäniemi, I.J. Maasilta, J. Low Temp. Phys. 151, 119 (2008)
K.D. Irwin, Nucl. Instrum. Methods Phys. Res., Sect. A, Accel. Spectrom. Detect. Assoc. Equip. 559, 718 (2006)
H.F.C. Hoevers, A.C. Bento, M.P. Bruijn, L. Gottardi, M.A.N. Korevaar, W.A. Mels, P.A.J. de Korte, Appl. Phys. Lett. 77, 4422 (2000)
K.M. Kinnunen, M.R.J. Palosaari, I.J. Maasilta (submitted for publication). arXiv:1111.4098v1
M. Lindeman et al., Rev. Sci. Instrum. 75, 1283 (2004)
I.J. Maasilta, K.M. Kinnunen, AIP Conf. Proc. 1185, 38 (2009)
Y. Zhao et al., IEEE Trans. Appl. Supercond. 21, 227 (2011)
I.J. Maasilta, to be published
J.A. Chervenak et al., Appl. Phys. Lett. 74, 4043 (1999)
Y. Takei et al., J. Low Temp. Phys. 151, 161 (2008)
A. Kozorezov et al., AIP Conf. Proc. 1185, 27 (2009)
Acknowledgements
This work was supported by ESA contract no. AO/1-4005/01/NL/HB, the Finnish Funding Agency for Technology and Innovation TEKES and EU through the regional funds, and the Finnish Academy project no. 128532. M. P. would like to thank the National Graduate School in Materials Physics for funding.
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Palosaari, M.R.J., Kinnunen, K.M., Ridder, M.L. et al. Analysis of Impedance and Noise Data of an X-Ray Transition-Edge Sensor Using Complex Thermal Models. J Low Temp Phys 167, 129–134 (2012). https://doi.org/10.1007/s10909-012-0471-4
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s10909-012-0471-4