Abstract
X-ray Photoelectron Spectroscopy and Raman spectroscopy are combined to evaluate the stoichiometry and charge state of building units in conductive films containing TTF, ET or TMTSF donors and [Ni(dmit)2] or [M(dcbdt)2] acceptors.
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Valade, L., Fraxedas, J., de Caro, D. et al. An Approach to the Origin of Transport Properties in a Series of Molecular Conductors, Based on XPS and Spectroscopic Studies. J Low Temp Phys 142, 141–146 (2006). https://doi.org/10.1007/s10909-006-9001-6
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DOI: https://doi.org/10.1007/s10909-006-9001-6