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Temperature stresses in hetrogeneous barium-titanate-based thermistors

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Journal of Engineering Physics and Thermophysics Aims and scope

Temperature stresses in semiconductor barium-titanate-based ceramics with a layer structure under the action of current loads have been investigated by numerical methods. It has been shown that by optimizing the thickness ratios between the layers and their properties one can markedly decrease the maximum stresses compared to homogeneous thermistors.

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References

  1. Barium-Titanate-Based Semiconductors [in Russian], Énergoizdat, Moscow (1982).

  2. B. Huybrechts, K. Ishizaki, and M. Takata, The positive temperature coefficient of resistivity in barium titanate, J. Mater. Sci., 30, 2463–2474 (1995).

    Article  Google Scholar 

  3. C. Dewitte, R. Elst, and F. Delannay, On the mechanism of delamination fracture of BaTiO3-based PTC thermistors, J. Eur. Ceram. Soc., 14, 481–492 (1994).

    Article  Google Scholar 

  4. B. M. Kulwicki, Instabilities in PTC resistors, in: Proc. 6th Int. Symp. on the Applications of Ferroelectrics. IEEE, Bethlehem, PA (1986), pp. 656–664.

  5. D. S. Smith, N. Ghayoub, I. Charissou, O. Bellon, and P. Abelard, Transient thermal gradients in barium titanate positive temperature coefficient (PTC) thermistors, J. Am. Ceram. Soc., 81, No. 7, 1789–1796 (1998).

    Article  Google Scholar 

  6. R. Ford and M. Kahn, Positive temperature coefficient resistor as high power pulse switches, in: Proc. 6th Int. Symp. on the Applications of Ferroelectrics. IEEE, Bethlehem, PA (1986), pp. 669–672.

  7. V. N. Shut, E. L. Gavrilenko, and A. V. Gavrilov, Temperature fields in titanate-barium-based thermistors, Materialovedenie, No. 2, 12–16 (2005).

    Google Scholar 

  8. V. N. Shut and A. V. Gavrilov, Temperature distribution in the vicinity of defects in semiconductor barium-titanate-based ceramics, Inzh.-Fiz. Zh., 80, No. 4, 181–185 (2007).

    Google Scholar 

  9. V. N. Shut and A. V. Gavrilov, Temperature stresses in barium-titanate-based semiconductor ceramics, Inzh.-Fiz. Zh., 81, No. 3, 596–601 (2008).

    Google Scholar 

  10. V. N. Shut and A. V. Gavrilov, Failure of PTCR-thermistors by separation, 4th Int. Conf. "Urgent Problems of Strength" [in Russian], Nizhnii Novgorod (2008), pp. 56–59.

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Correspondence to V. N. Shut.

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Translated from Inzhenerno-Fizicheskii Zhurnal, Vol. 82, No. 5, pp. 981–983, September–October, 2009.

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Shut, V.N., Gavrilov, A.V. Temperature stresses in hetrogeneous barium-titanate-based thermistors. J Eng Phys Thermophy 82, 988–990 (2009). https://doi.org/10.1007/s10891-009-0269-7

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  • DOI: https://doi.org/10.1007/s10891-009-0269-7

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