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STEM-HAADF electron microscopy analysis of the central dark line defect of human tooth enamel crystallites

Abstract

When human tooth enamel is observed with the Transmission Electron Microscope (TEM), a structural defect is registered in the central region of their nanometric grains or crystallites. This defect has been named as Central Dark Line (CDL) and its structure and function in the enamel structure have been unknown yet. In this work we present the TEM analysis to these crystallites using the High Angle Annular Dark Field (HAADF) technique. Our results suggest that the CDL region is the calcium richest part of the human tooth enamel crystallites.

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Acknowledgements

We acknowledge to L. Rendón, C. Magaña, R. Hernández, J. Cañetas, S. Tehuacanero, P. Mexía, and M. Aguilar for their technical help. We thank the Laboratorio Central de Microscopy of the IFUNAM for electron microscopy facilities. We also acknowledge the economical support from DGAPA-UNAM under the project IN-117906.

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Correspondence to Jose Reyes Gasga.

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Gasga, J.R., Carbajal-de-la-Torre, G., Bres, E. et al. STEM-HAADF electron microscopy analysis of the central dark line defect of human tooth enamel crystallites. J Mater Sci: Mater Med 19, 877–882 (2008). https://doi.org/10.1007/s10856-007-3174-7

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  • DOI: https://doi.org/10.1007/s10856-007-3174-7

Keywords

  • Scanning Transmission Electron Microscope
  • High Angle Annular Dark Field
  • Human Tooth Enamel
  • Enamel Sample
  • Enamel Structure