Abstract
In the present work, RF sputtering synthesis method is used for the synthesis of tungsten diselenide (WSe2) films. These WSe2 films were studied using X-ray diffraction (XRD), Raman spectroscopy, X-ray photoelectron spectroscopy (XPS), and UV–Visible spectroscopy techniques. Further, Co-60 gamma rays of 1 kGy, 10 kGy, and 100 kGy doses were irradiated on these films. The structural characterization techniques XRD and Raman spectra show that with increase in gamma dose of WSe2 film increases the strain \(\left( \varepsilon \right)\) produced in the material. For validation of oxygen occupying the selenium vacancy in WSe2 thin film is confirmed through X-ray photoelectron spectroscopy (XPS) spectra. The optical band gap is also seen to decrease from 1.60 to 1.14 eV with the increasing gamma dose from 1 to 100 kGy, and can be attributed to the defect induced in the WSe2 sample. The I–V curve also shows a significant linear increase in current of gamma-irradiated WSe2 thin films. These changes induced in the structural, optical and electrical properties of the WSe2 thin films due to gamma irradiation have proved possible applications of these samples in optoelectronics, space, and defense system.
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Acknowledgements
P. T. Kolhe is grateful to Chhatrapati Shahu Maharaj Research, Training and Human Development Institute (SARTHI), Pune for the award of CSMNRF-2020 Fellowship. Y.V. Hase is thankful to the Ministry of New and Renewable Energy (MNRE), Government of India, for the financial support under the National Renewable Energy Fellowship (NREF) program. P. R. Jadhav is grateful to Mahatma Jyotiba Phule Research & Training Institute (MAHAJYOTI), Nagpur for the financial assistance through the fellowship MAHAJYOTI-2021. Authors are thankful to various funding agencies for providing the financial support to purchase the following characterization techniques: SEM/UV–Visible (DST-FIST-SR/FST/PS II-003/2000), Raman Spectroscopy (UPE Phase II 1-11-2012(NS/PE)), XRD (UGC-CNQS-1-11/2001(NS/PE)), XPS (SR/FST/PSII-034/2015 (G)).
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PTK: conceptualization, methodology, data curation, software, writing—original draft SND: resources, formal analysis YVH: methodology PRJ: resources VSG: resources. SRJ: resources SDD: resources, investigation SSD: writing—review and editing, supervision, validation.
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Kolhe, P.T., Dalvi, S.N., Hase, Y.V. et al. Effect of gamma-ray irradiation on structural and optical property of WSe2 film. J Mater Sci: Mater Electron 34, 1704 (2023). https://doi.org/10.1007/s10854-023-11088-0
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DOI: https://doi.org/10.1007/s10854-023-11088-0