Abstract
Hard–soft CoFe2O4/Ni0.3CuxZnyFe2O4 (x, y ≤ 0.5) spinel ferrite nanofibers (H/S CFO/CuZnFO SFNFs) were synthesized via electro-spin. The main aim of this study is to investigate effect of co-substitution of transition metals of Cu and Zn on the dielectric features of H/S CFO/NiFO SFNFs. The microstructure and morphology of all products were studied by XRD, SEM along with EDX, TEM and HR-TEM. The dielectric features of all products were evaluated as a function of frequency, F (1 MHz–3 GHz), and temperature, T (20–120 °C). The T-dependent AC and DC conductivity of all products improved with T, in agreement with the semiconductor behavior. While AC conductivity revealed two regions as F-dependent and F-independent, DC conductivities exhibited Arrhenius-type behavior above and below the transition T. Thermally stimulated charge transfer model produced activation energies before and after transition T ranging between Ea = 78 and 297 meV, which is consistent with AC and DC conductivities. The dielectric loss, dielectric constant and dielectric loss tangent of all nanofibers decreased with the increase in F at all T. The Cole–Cole plots were used to analyze the effect of grain and grain boundary on conduction mechanism, and they displayed mainly only one incomplete semicircle signifying non-Debye behavior and domination of grain boundaries to the conduction mechanism. The dielectric parameters of all samples vary significantly with compositional ratio. The dielectric behaviors of H/S CFO/CuZnFO SFNFs are correlated with the conduction mechanisms based on grain-to-grain boundaries, clarified by Koop's model.
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MAA and HE conceived and designed the work. HE took part in investigation, writing and explaining. YS and AS carried out the formal analysis. AB was responsible for project administration, editing and writing—reviewing and editing.
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Almessiere, M.A., Erdemi, H., Sadaqat, A. et al. Electrical and dielectric properties of hard/soft CoFe2O4/Ni0.3CuxZnyFe2O4 (x, y ≤ 0.5) spinel ferrite nanofibers. J Mater Sci: Mater Electron 34, 213 (2023). https://doi.org/10.1007/s10854-022-09589-5
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DOI: https://doi.org/10.1007/s10854-022-09589-5