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Growth, electrical, electronic, NLO, spectral, SEM studies of LA crystals of macro, micro-scales for utilization in devices, displays and in micro-photonics

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Abstract

The L-Alanine (LA) crystals are grown using slow evaporation method with the cell dimensions as a = 5.7780(5) Å; b = 6.0284(6) Å; c = 12.3237(12) Å. The dielectric constant and dielectric loss of the LA micro crystals are having higher value at low frequencies and lower value at higher value of frequencies; Z Scan methodology envisages the nonlinear nature of LA specimen; the third order non linear susceptibility is 1.90 × 10–6 esu; 8.89 × 10–6 esu for macro, micro scalings and having phase matching proviso for micro-LA of 38.2 mV. The doubling esteem of Op-amp for the input frequency is properly analyzed for the macro; micro level coated ones and is of 2.07 times that of the input esteem, 2.12 times that of the input esteem. The values of 2.9876, 3.4343 and 3.8912 microns for macro, thin-film and micro level influx of LA. Voltage regulation enhancing the use in boosting and bucking materials with LA micro-ones. The LA micro crystalline material is of 10 μm specification tells that the specimen has no flaws; the stereographic consequence of LA crystal with hkl max and Laue’s effect of LA crystal with 2717 reflections and angle portrayal for hkl1 as (100) and hkl2 as (111) is 46.85°; the computational approach for LA for Halosian impactness for projection in a giant scale. The weak interaction profile of 50% effect by VanderWaal’s is properly portrayed; the nano-tube of 22 nm of 3 × 3 value of n, m for peptide bond of Arginine triplets case for 5 × 5 × 5 holder of LA are pronounced with the 4 × 4 × 4 super cell impacting of LA material. The projected data of LA structure for (101) orientation and for (111) orientation with the cloned cluster effect of LA crystals for thermal imaging; cluster effectiveness; to be employed in imaging and display circuits also analyzed for micro-photonic utilities with 3.98 eV.

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Data are not submitted anywhere and all studies performed are presented here; no data separately available in any system or mode.

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Acknowledgements

The authors thank for the facilities of SXRD from Cochin University; dielectric from LC, Chennai; electronic use from Phoenix Group-Nagai and SIMATS; SEM from IITM; NLO from Crescent Univ.

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The authors have not disclosed any funding.

Author information

Authors and Affiliations

  1. Department of Electronics and Communication Engineering, E.G.S.Pillay Engineering College, Nagapattinam, Tamil Nadu, 611002, India

    V. Kalaipoonguzhali

  2. Department of Mechanical Engineering, Sri Venkateswara College of Engineering and Technology (A), Chittoor, Andhra Pradesh, 517127, India

    S. Surendarnath

  3. Department of Physics, Saveetha School of Engineering, SIMATS, Chennai, Tamil Nadu, 602105, India

    M. Vimalan

  4. Department of Physics/R and D, Edayathangudy G.S Pillay Arts and Science College (Autonomous-Affiliated to Bharathidasan University, Trichy 620024), Nagapattinam, Tamil Nadu, 611002, India

    K. SenthilKannan

  5. R and D (V), Phoenix Group, Nagapattinam, Tamil Nadu, 611001, India

    K. SenthilKannan

Authors
  1. V. Kalaipoonguzhali
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  2. S. Surendarnath
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  3. M. Vimalan
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  4. K. SenthilKannan
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Contributions

VK—contributed to electrical, electronic analysis of all influx. SS—contributed to SEM with interactions of the surface and thermal projection. MV—Submission, computational interactions and surface impactness of micro-crystals. KS—contributed to crystal growth, overall write up, other studies NLO and paper responsibility, analyzed XRD and device use, clone effect.

Corresponding authors

Correspondence to M. Vimalan or K. SenthilKannan.

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Kalaipoonguzhali, V., Surendarnath, S., Vimalan, M. et al. Growth, electrical, electronic, NLO, spectral, SEM studies of LA crystals of macro, micro-scales for utilization in devices, displays and in micro-photonics. J Mater Sci: Mater Electron 34, 107 (2023). https://doi.org/10.1007/s10854-022-09586-8

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