Abstract
In this work, a facile approach has been adopted to synthesize zinc titanium oxide (ZnTiO3) using the solution combustion synthesis technique for resistive memory application. The synthesized ZnTiO3 has been thoroughly characterized using different analytical tools. The fabricated Al/ZnTiO3/FTO device demonstrates good bipolar resistive switching property and a non-ideal memristive effect. Furthermore, switching voltages dynamics were modeled using time series analysis based on autoregressive integrated moving average (ARIMA) and Holt-Winter’s exponential smoothing (HWES) techniques. The non-volatile memory measurements suggested that the Al/ZnTiO3/FTO memristive device can switch between 103 endurance cycles and can retain data up to 104 s. The conduction analysis and plausible filamentary type RS mechanism are investigated for the fabricated memristive device. The present work demonstrates the benefits of the solution-processable RS device for non-volatile memory application and the use of statistical time series analysis for understanding the switching voltage dynamics.
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References
H. Wong, S. Salahuddin, Nat. Nanotechnol. 10, 191 (2015)
J. Meena, S. Sze, U. Chand, T. Tseng, Nanoscale Res. Lett. 9, 526 (2014)
L. Chua, IEEE Trans. Circuit Theory 18, 507 (1971)
D. Strukov, G. Snider, D. Stewart, R. Williams, Nature 453, 80 (2008)
S. Slesazeck, T. Mikolajick, Nanotechnology 30, 352003 (2019)
D. Ielmini, Microelectron. Eng. 190, 44 (2018)
D. Ielmini, H. Wong, Nat. Electron. 1, 333 (2018)
J. Feng, W. Hu, F. Zeng, H. Lin, L. Li, B. Yang, Y. Peng, D. Wu, B. Huo, X. Tang, Appl. Phys. Lett. 117, 192102 (2020)
A.V. Pawar, S.S. Kanapally, K.D. Kadam, S.L. Patil, V.S. Dongle, S.A. Jadhav, S. Kim, T.D. Dongale, J. Mater. Sci. Mater. Electron. 30, 11383 (2019)
W. Xia, Y. Suna, C. Yin, G.L. Jia, W. Zhang, AIP Adv. 10, 105319 (2020)
K. Biju, X. Liu, S. Kim, S. Jung, J. Park, Phys. Status Solidi RRL 5, 89 (2011)
G. Sassine, S. La Barbera, M. Najjari, N. Minvielle, C. Dubourdieu, F. Alibart, J. Vac. Sci. Technol. 34, 012202 (2016)
X. Guan, W. Hu, M. Haque, N. Wei, Z. Liu, A. Chen, T. Wu, Adv. Funct. Mater. 28, 1704665 (2018)
C. Hu, Q. Wang, S. Bai, M. Xu, D. He, D. Lyu, J. Qi, Appl. Phys. Lett. 110, 073501 (2017)
S. Gao, X. Yi, J. Shang, G. Liu, R.W. Li, Chem. Soc. Rev. 48, 1531 (2019)
Y. Shan, Z. Lyu, X. Guan, A. Younis, G. Yuan, J. Wang, S. Li, T. Wu, Phys. Chem. Chem. Phys. 20, 23837 (2018)
N. Raeis-Hosseini, J. Lee, J. Electroceram. 39, 223 (2017)
D. Ielmini, Semicond. Sci. Technol. 31, 063002 (2016)
B. Sun, G. Zhou, L. Sun, H. Zhao, Y. Chen, F. Yang, Y. Zhao, Q. Song, Nanoscale Horiz. 6, 939–970 (2021)
P. Tahay, Y. Khani, M. Jabari, F. Bahadoran, B.N. Safari, A. Zamanian, Int. J. Hydrog. Energy. 45, 9484 (2020)
G. Bhagyalekshmi, A. Neethu, D. Rajendran, J. Mater. Sci.: Mater. Electron. 30, 10673 (2019)
P. Su, X. Liu, Sensors (Basel) 20, 46 (2019)
L. Zhao, F. Liu, X. Wang, Z. Zhang, J. Yan, Sol-Gel Sci. Technol. 33, 103 (2005)
C. Zhang, X. Li, T. Zheng, Y. Yang, Y. Li, Y. Li, C. Wang, L. Li, Desalin. Water Treat. 45, 324 (2012)
B. Lokesh, N. Rao, J. Mater. Sci. Mater. Electron. 27, 4253 (2016)
M. Vaezi, A. Kandjani, L. Nikzad, N. Arefian, S. Alibeigi, M. Tabriz, S. Ghassemi, J. Samei, Mater. Sci.-Pol. 25, 1109 (2017)
O. Thoda, G. Xanthopoulou, G. Vekinis, A. Chroneos, Adv. Eng. Mater. 20, 1800047 (2018)
A. Varma, A. Mukasyan, A. Rogachev, K.V. Manukyan, Chem. Rev. 116, 14493 (2016)
S.R. Patil, M.Y. Chougale, T.D. Rane, S.S. Khot, A.A. Patil, O.S. Bagal, S.D. Jadhav, A.D. Sheikh, S. Kim, T.D. Dongale, Electronics 7, 445 (2018)
H. Kim, J. Hwang, J. Nam, B. Choi, M. Lanagan, J. Mater. Res. 18, 1067 (2013)
Y. Cai, Y. Ye, Z. Tian, J. Liu, Y. Liu, C. Liang, Phys. Chem. Chem. Phys. 15, 20203 (2013)
J. Li, H. Cui, D. Mu, Y. Liu, T. Guan, Z. Xia, L. Jiang, J. Zuo, C. Tan, H. You, New J. Chem. 43, 3374 (2019)
Y. Tu, S. Chen, X. Li, J. Gorbaciova, W.P. Gillin, S. Krause, J. Briscoe, J. Mater. Chem. C 6, 1815 (2018)
A.R. Patil, T.D. Dongale, S.S. Nirmale, R.K. Kamat, K.Y. Rajpure, Mater. Today Commun. 28, 102621 (2021)
A. Phani, M. Passacantando, S. Santucci, J. Phys. Chem. Solids 68, 317 (2007)
C. Yunyu, Y. Yixing, T. Zhenfei, L. Jun Liu, L. Yishu, L. Changhao, Phys. Chem. Chem. Phys. 15, 20203 (2013)
D.S. Jeon, T.D. Dongale, T.G. Kim, J. Alloys Compd. 884, 161041 (2021)
A.A. Patil, S.V. Wagh, T.D. Dongale, D.K. Kim, Mater. Lett. 280, 128587 (2020)
S. Yu, B. Gao, H. Dai, B. Sun, L. Liu, X. Liu, R. Han, J. Kang, B. Yu, Electrochem. Solid-State Lett. 13, H36 (2009)
W.Y. Chang, H.W. Huang, W.T. Wang, C.H. Hou, Y.L. Chueh, J.H. He, J. Electrochem. Soc. 159, G29 (2012)
H. Xie, Q. Liu, Y. Li, H. Lv, M. Wang, X. Liu, H. Sun, X. Yang, S. Long, S. Liu, M. Liu, Sci. Technol. 27, 125008 (2012)
P.J. Brockwell, R.A. Davis, ARMA Models (Springer, Cham, 2016)
J.B. Roldán, F.J. Alonso, A.M. Aguilera, D. Maldonado, M. Lanza, J. Appl. Phys. 125, 174504 (2019)
N. Rodriguez, D. Maldonado, F.J. Romero, F.J. Alonso, A.M. Aguilera, A. Godoy, F. Jimenez-Molinos, F.G. Ruiz, J.B. Roldan, Materials. 12, 3734 (2019)
C.C. Holt, Int. J. Forecast. 20, 5 (2004)
P.R. Winters, Manage. Sci. 6, 324 (2004)
N. Du, Y. Shuai, W. Luo, C. Mayr, R. Schüffny, O.G. Schmidt, H. Schmidt, Rev. Sci. Instrum. 84, 023903 (2013)
A.P. Patil, K.A. Nirmal, S.S. Mali, C.K. Hong, T.G. Kim, P.S. Patil, T.D. Dongale, Mater. Sci. Semicond. Process. 115, 105110 (2020)
E.W. Lim, R. Ismail, Electronics 4, 586 (2015)
C. Funck, S. Menzel, ACS Appl. Electron. Mater. 3, 3674 (2021)
T.D. Dongale, A.C. Khot, A.V. Takaloo, T.G. Kim, NPG Asia Mater. 13, 16 (2021)
S. Zhu, B. Sun, S. Ranjan, X. Zhu, G. Zhou, H. Zhao, S. Mao, H. Wang, Y. Zhao, G. Fu, APL Mater. 7, 081117 (2019)
G. Zhou, Z. Ren, B. Sun, J. Wu, Z. Zou, S. Zheng, L. Wang, S. Duan, Q. Song, Nano Energy 68, 104386 (2020)
S. Mao, B. Sun, G. Zhou, Y. Yang, H. Zhao, Y. Zhou, Y. Chen, Y. Zhao, Appl. Surf. Sci. 595, 153560 (2022)
W. Sun, B. Gao, M. Chi, Q. Xia, J.J. Yang, H. Qian, H. Wu, Nat. Commun. 10, 3453 (2019)
V. Fra, M. Beccaria, G. Milano, S. Guastella, S. Bianco, S. Porro, M. Laurenti, S. Stassi, C. Ricciardi, Nanotechnology 31, 374001 (2020)
A. Younis, D. Chu, X. Lin, J. Yi, F. Dang, S. Li, ACS Appl. Mater. Interfaces 5, 2249–2254 (2013)
L. Hu, W. Han, H. Wang, Nanotechnology 31, 155202 (2020)
G. Shin, C. Kim, G. Bang, J. Kim, B. Jang, B. Koo, M. Woo, Y. Choi, S. Choi, 2D Mater. 3, 034002 (2016)
B. Sun, W. Zhao, L. Wei, H. Li, P. Chen, Chem. Commun. 50, 13142–13145 (2014)
Funding
This study is supported by financial assistance under the ‘RUSA-Industry Sponsored Centre for VLSI System Design’, Maharashtra state.
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APP: Conceptualization, Methodology, Investigation, Validation, Formal analysis, Writing – original draft. CCR: Methodology, Formal analysis, Visualization. GUK: Formal analysis, Investigation. SSK: Formal analysis Visualization. SJK: Formal analysis, Visualization. SSS: Supervision, Formal analysis, Investigation. PJP: Formal analysis, Visualization. TDD: Conceptualization, Investigation, Resources, Writing – original draft, Supervision, Writing – review & editing.
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Patil, A.P., Revadekar, C.C., Kamble, G.U. et al. Investigations on resistive switching effect and time series statistical analysis of solution combustion synthesized ZnTiO3 memristive device. J Mater Sci: Mater Electron 33, 23390–23403 (2022). https://doi.org/10.1007/s10854-022-09100-0
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DOI: https://doi.org/10.1007/s10854-022-09100-0