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Raman spectroscopic investigation and thermoelectric studies of defect-induced Mg-doped delafossite thin film

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Abstract

Here, we modified the band structure of P-type Mg-doped CuCrO2 thin films by defect-induced lattice compressive strain. A significant increase in p-type conductivity of 33.44 S cm−1 and enhanced power factor of 679.44 μW m−1 K−2 at 200 °C were observed for the film of thickness 211 nm. The increased strain from XRD calculations and phonon vibrations mode features of the grown film from Raman spectroscopic investigations, giving an insight to the thermal phonon mode lead to thermoelectric features of the material. Hall effect measurements substantiate the results.

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Acknowledgements

The authors would like to thank UGC-SAP (Government of India) and FIST (DST, Government of India) for providing the research facilities and DST SERB (Government of India) for providing the major research Project SB/EMEQ-002/2013 in the Department of Physics, University of Calicut. The Central Sophisticated Instrumentation Facility (CSIF), University of Calicut for characterization facilities, and Department of physics, Farook College, Kozhikode provided the facility for the synthesis part.

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Authors and Affiliations

  1. Department of Physics, University of Calicut, Malappuram, Kerala, 673635, India

    P. K. Jamshina Sanam, Midhun Shah & P. P. Pradyumnan

  2. Department of Physics, Farook College, Kozhikode, Kerala, 673632, India

    Midhun Shah

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Contributions

Conceptualization: [PKJS, PPP]; Methodology: [PKJS]; Formal analysis and investigation: [PKJS]; Writing—original draft preparation: [PKJS]; Writing—review and editing: [PKJS, MS, PPP]; Resources: [PKJS, MS]; Supervision: [PPP]

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Correspondence to P. P. Pradyumnan.

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Sanam, P.K.J., Shah, M. & Pradyumnan, P.P. Raman spectroscopic investigation and thermoelectric studies of defect-induced Mg-doped delafossite thin film. J Mater Sci: Mater Electron 33, 22346–22360 (2022). https://doi.org/10.1007/s10854-022-09013-y

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