Abstract
Photoluminescence and scintillation properties of RbI single crystals with various Tl-concentrations (0.1%, 0.3%, 1%, and 3%) were investigated. Under an excitation at ~ 300 nm, all the samples exhibit an emission peak at ~ 420 nm. This emission peak is due to 3P1→1S0 transitions of Tl+ ions. Under X-ray excitation, all the samples exhibit a broad peak (~ 420 nm) and a shoulder like structure (~ 500 nm) due to Tl+ ions. According to pulse height spectra under 137Cs γ-ray irradiation, the 0.3% Tl-doped sample shows the highest light yield of 7300 ph/MeV among the samples.
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The data that support the findings of this study are available from the corresponding author, K. Miyazaki, upon reasonable request.
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Acknowledgements
This work was supported by Grant-in-Aid for Scientific Research A (22H00309), Scientific Research B (21H03733, 21H03736, 22H02939 and 22H03872) from Japan Society for the Promotion of Science. Foundation from Cooperative Research Project of Research Center for Biomedical Engineering, and Nippon Sheet Glass Foundation, Terumo Life Science Foundation, Iwatani Naoji Foundation, and Konica Minolta Science and Technology Foundation are also acknowledged.
Funding
This work was supported by Grant-in-Aid for Scientific Research A (22H00309), Scientific Research B (21H03733, 21H03736, 22H02939 and 22H03872) from Japan Society for the Promotion of Science. Foundation from Cooperative Research Project of Research Center for Biomedical Engineering, and Nippon Sheet Glass Foundation, Terumo Life Science Foundation, Iwatani Naoji Foundation, and Konica Minolta Science and Technology Foundation are also acknowledged.
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KM: Conceptualization, Investigation, Writing-original draft preparation. DN: Investigation, Writing-Review & Editing. TK: supervision. NK: Supervision. TY: Writing-Review & Editing.
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Miyazaki, K., Nakauchi, D., Kato, T. et al. Tl-concentration dependence of photoluminescence and scintillation properties in Tl-doped RbI single crystals. J Mater Sci: Mater Electron 33, 22162–22168 (2022). https://doi.org/10.1007/s10854-022-08996-y
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DOI: https://doi.org/10.1007/s10854-022-08996-y