Abstract
A study of the investigation of tin oxide (SnO2) thin films deposited by spray pyrolysis method was undertaken by analysing the structural and optical properties for different substrate temperatures. X-ray diffraction patterns have revealed that the formation of tetragonal tin oxide nanoparticles was observed and the crystallite size, strain and dislocation density of the samples vary with the substrate temperature. In addition, X-ray photoelectron spectroscopy was used to obtain the composition and electronic structure. From morphological characterization, it is clear that the thin films are uniform without cracks with dense morphology consisting homogenous distribution of crystallites in nanometer dimension. Analysis on optical properties revealed that the direct optical band gap of the SnO2 films lies between 3.88 and 3.98 eV up to the substrate temperature of 450 °C, and it showed a remarkable decrease to 3.73 eV for 500 °C. The envelope method analysis based on the use of the maxima and minima of the interference fringes has been used to define the complex index of refraction and the extinction coefficient. Photoluminescence characteristics of the SnO2 thin films were investigated at room temperature. The all photoluminescence spectra have exhibited six luminescence centres ascribed to the presence of intrinsic defects such as oxygen vacancies and structural defects in the SnO2. Two of them are for room-temperature radiative recombinations of band-acceptor and donor–acceptor pairs observed at 420 and 451 nm, respectively. All of the results have been appreciated for optoelectronic and sensor devices.
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References
P.A. Luque, O. Nava, C.A. Soto-Robles, H.E. Garrafa-Galvez, M.E. Martinez-Rosas, M.J. Chinchillas-Chinchillas, A.R. Vilchis-Nestor, A. Castro-Beltran, J. Mater. Sci. 31, 16859 (2020). https://doi.org/10.1007/s10854-020-04242-5
C.G. Granqvist, Appl. Opt. 20, 2606 (1981). https://doi.org/10.1364/AO.20.002606
S.K. Godlaveeti, A.R. Somala, S.S. Sana, M. Ouladsmane, A.A. Ghfar, R.R. Nagireddy, J. Clust. Sci. (2021). https://doi.org/10.1007/s10876-021-02092-7
X. Sun, Y. Huang, M. Zong, H. Wu, X. Ding, J. Mater. Sci-Mater. El 27, 2682 (2016). https://doi.org/10.1007/s10854-015-4077-x
C.G. Granqvist, Sol. Energy Mat. Sol. C 91, 1529 (2007). https://doi.org/10.1016/j.solmat.2007.04.031
E.P. Simonenko, N.P. Simonenko, A.S. Mokrushin, A.A. Vasiliev, I.S. Vlasov, I.A. Volkov, T. Maeder, V.G. Sevastyanov, N.T. Kuznetsov, Russ. J. Inorg. Chem. 63, 851 (2018). https://doi.org/10.1134/S0036023618070197
S. Gürakar, T. Serin, N. Serin, Adv. Mater. Lett. 5, 309 (2014). https://doi.org/10.5185/amlett.2014.amwc.1016
Z.M. Jarzebski, J.P. Marton, J. Electrochem. Soc. 123, 299C (1976). https://doi.org/10.1149/1.2133090
S. Das, V. Jayaraman, Prog. Mater. Sci. 66, 112 (2014). https://doi.org/10.1016/j.pmatsci.2014.06.003
T.P. Chow, M. Ghezzo, B.J. Baliga, J. Electrochem. Soc. 129, 1040 (1982). https://doi.org/10.1149/1.2124012
S. Vadivel, G. Rajarajan, J. Mater. Sci. 26, 7127 (2015). https://doi.org/10.1007/s10854-015-3335-2
M. Aziz, S.S. Abbas, W.R.W. Baharom, W.Z.W. Mahmud, Mater. Lett. 74, 62 (2012). https://doi.org/10.1016/j.matlet.2012.01.073
M. Velumani, S.R. Meher, Z.C. Alex, J. Mater. Sci. 29, 3999 (2018). https://doi.org/10.1007/s10854-017-8342-z
D.A. Qader, R.A. Ismail, A.A. Mossa, K.I. Hassoon, J. Mater. Sci. 22, 1681 (2011). https://doi.org/10.1007/s10854-011-0345-6
X. Wang, R. Huang, X.Y. Kong, Appl. Phys. A 116, 1959 (2014). https://doi.org/10.1007/s00339-014-8366-7
M. Batzill, J.M. Burst, U. Diebold, Thin Solid Films 484, 132 (2005). https://doi.org/10.1016/j.tsf.2005.02.016
P.I. Gaiduk, A.N. Kozjevko, S.L. Prokopjev, C. Tsamis, A. NylandstedLarsen, Appl. Phys. A 91, 667 (2008). https://doi.org/10.1007/s00339-008-4505-3
E. Elangovan, M.P. Singha, M.S. Dharmaprakashb, K. Ramamurthi, J. Optoelectron. Adv. Mater. 6, 197 (2004)
S. Bansal, D.K. Pandya, S.C. Kashyap, D. Haranath, J. Alloy Compd. 583, 186 (2014). https://doi.org/10.1016/j.jallcom.2013.08.135
S. Bansal, D.K. Pandya, S.C. Kashyap, Physica E 135, 114965 (2022). https://doi.org/10.1016/j.physe.2021.114965
H.P. Asha, N.B. Gummagol, P. ShankaragoudaPatil, B.V. Rajendra, Superlattice Microstruct. 155, 106920 (2021). https://doi.org/10.1016/j.spmi.2021.106920
G. Blattner, C. Klingshirn, R. Helbig, Solid State Commun. 33, 341 (1980). https://doi.org/10.1016/0038-1098(80)91166-7
A. Kar, M.A. Stroscio, M. Dutta, J. Kumari, M. Meyyappan, Semicond. Sci. Technol. 25, 024012 (2010). https://doi.org/10.1088/0268-1242/25/2/024012
R. Chen, G.Z. Xing, J. Gao, Z. Zhang, T. Wu, H.D. Sun, Appl. Phys. Lett. 95, 061908 (2009). https://doi.org/10.1063/1.3205122
X. Feng, J. Ma, F. Yang, F. Ji, F. Zong, C. Luan, H. Ma, Solid State Commun. 144, 269 (2007). https://doi.org/10.1016/j.ssc.2007.07.028
B. Liu, C.W. Cheng, R. Chen, Z.X. Shen, H.J. Fan, H.D. Sun, J. Phys. Chem. C 114, 3407 (2010). https://doi.org/10.1021/jp9104294
M. Gaidi, A. Hajjaji, R. Smirani, B. Bessais, M.A. El Khakani, J. Appl. Phys. 108, 063537 (2010). https://doi.org/10.1063/1.3485811
H. Shao-Bo, W. Shi-Fa, D. Qing-Ping, Y. Xiao-Dong, Z. Wan-Guo, X. Xia, L. Zhi-Jie, Z. Xiao-Tao, Chin. Phys. B 22, 058102 (2013). https://doi.org/10.1088/1674-1056/22/5/058102
M. Kul, M. Zor, A.S. Aybek, S. Irmak, E. Turan, Sol. Energy Mater. Sol. C 91, 882 (2007). https://doi.org/10.1016/j.solmat.2007.01.020
E. Turan, M. Zor, M. Kul, A.S. Aybek, T. Taskopru, Philos. Mag. 92, 1716 (2012). https://doi.org/10.1080/14786435.2012.657708
B.D. Cullity, S.R. Stock, Elements of X-ray Diffraction, 3rd edn. (Prentice-Hall, New York, 2001)
K. Gurumurugan, D. Mangalaraj, S.K. Narayandass, K. Sekar, C.P.G. Vallabhan, Semicond. Sci. Technol. 9, 1827 (1994)
F.C. Eze, Mater. Chem. Phys. 89, 205 (2005). https://doi.org/10.1016/j.matchemphys.2003.11.039
R. Ghosh, D. Basaka, S. Fujihara, J. Appl. Phys. 96, 2689 (2004). https://doi.org/10.1063/1.1769598
H. Köse, Ş Karaal, A.O. Aydin, H. Akbulut, Mater. Sci. Semicond. Process. 38, 404 (2015). https://doi.org/10.1016/j.mssp.2015.03.028
J.R. Mohamed, C. Sanjeeviraja, L. Amalraj, J. Asian Ceram. Soc. 4, 191 (2016). https://doi.org/10.1016/j.jascer.2016.03.002
G.K. Williamson, R.E. Smallman, Philos. Mag. 1, 34 (1956). https://doi.org/10.1080/14786435608238074
M.A. Yıldırım, S. Tuna Yıldırım, E. Fedakar Sakar, A. Ateş, Spectrochim. Acta A 133, 60 (2014). https://doi.org/10.1016/j.saa.2014.05.035
A. Tombak, Y.S. Ocak, F. Bayansal, Appl. Surf. Sci. 493, 1075 (2019). https://doi.org/10.1016/j.apsusc.2019.07.087
L. Yang, X. Zhou, L. Song, Y. Wang, X. Wu, N. Han, Y. Chen, A.C.S. Appl, Nano Mater. 1, 6327 (2018)
S.K. Sinha, S. Ghosh, Physica E 84, 434 (2016). https://doi.org/10.1016/j.physe.2016.07.019
Y. Wu, Y. Lin, J. Xu, Photochem. Photobiol. Sci. 18, 1081 (2019). https://doi.org/10.1039/C8PP00493E
J.I. Pankove, Optical Processes in Semiconductors, 2nd edn. (Dover, New York, 1976), pp. 35–36
V. Sharma, Tin Oxide Materials Synthesis, Properties, and Applications (Elsevier, Amsterdam, 2020), p. 61
P. Chetri, A. Choudury, Physica E 47, 257 (2013). https://doi.org/10.1016/j.physe.2012.11.011
W. Zhou, Y. Liu, Y. Yang, P. Wu, J. Phys. Chem. C 118, 6448 (2014). https://doi.org/10.1021/jp500546r
J.C. Manifacier, J. Gasiot, J.P. Fillard, J. Phys. E 9, 1002 (1976). https://doi.org/10.1088/0022-3735/9/11/032
D.B. Kushev, N.N. Zheleva, Y. Demakopoulou, D. Siapkas, Infrared Phys. 26, 385 (1986). https://doi.org/10.1016/0020-0891(86)90063-1
M. Anastasescu, M. Gartner, S. Mihaiu, C. Anastasescu, M. Purica, E. Manea, M.Zaharescu, 2006 International Semiconductor Conference, pp. 163–166 (2006) https://doi.org/10.1109/SMICND.2006.283958
S. Baco, A. Chik, FMd. Yassin, J. Sci. Technol. 4, 61 (2012)
J.P. Chatelon, C. Terrier, J.A. Roger, Semicond. Sci. Technol. 14, 642 (1999). https://doi.org/10.1088/0268-1242/14/7/310
E. Turan, E. Zeybekoğlu, M. Kul, Thin Solid Films 692, 137632 (2019). https://doi.org/10.1016/j.tsf.2019.137632
C. Kittel, Introduction to Solid State Physics, 8th edn. (Wiley, New York, 1986), p. 397
Y. Mi, H. Odaka, S. Iwata, Jpn. J. Appl. Phys. 38, 3453 (1999). https://doi.org/10.1143/JJAP.38.3453
S.H. Luo, Q. Wan, W.L. Liu, M. Zhang, Z.T. Song, C.L. Lin, P.K. Chu, Prog. Solid State Chem. 33, 287 (2005). https://doi.org/10.1016/j.progsolidstchem.2005.11.008
M. Bhatnagar, V. Kaushik, A. Kaushal, M. Singh, B.R. Mehta, AIP Adv. 6, 095321 (2016). https://doi.org/10.1063/1.4964313
R. Bargougui, K. Omri, A. Mhemdi, S. Ammar, Adv. Mater. Lett. 6, 816 (2015). https://doi.org/10.5185/amlett.2015.5844
C.V. Reddy, R.V.S.S.N. Ravikumar, G. Srinivas, J. Shim, M. Cho, Mater. Sci. Eng. B 221, 63 (2017). https://doi.org/10.1016/j.mseb.2017.04.002
A. Kar, M.A. Stroscio, M. Dutta, J. Kumari, M. Meyyappan, Appl. Phys. Lett. 94, 101905 (2009). https://doi.org/10.1063/1.3097011
C.G. Fonstad, R.H. Rediker, J. Appl. Phys. 42, 2911 (1971). https://doi.org/10.1063/1.1660648
J.A. Marley, R.C. Dockerty, Phys. Rev. 140, A304 (1965). https://doi.org/10.1103/PhysRev.140.A304
Ç. Kılıç, A. Zunger, Phys. Rev. Lett. 88, 095501 (2002). https://doi.org/10.1103/PhysRevLett.88.095501
F. Gu, S.F. Wang, C.F. Song, M.K. Lü, Y.X. Qi, G.J. Zhou, D. Xu, D.R. Yuan, Chem. Phys. Lett. 372, 451 (2003). https://doi.org/10.1016/S0009-2614(03)00440-8
J. Gajendiran, V. Rajendran, Mater. Lett. 139, 116 (2015). https://doi.org/10.1016/j.matlet.2014.10.056
B.K. Vinayak, M.U. Arun, AIP Adv. 3, 082120 (2013). https://doi.org/10.1063/1.4819451
A. Kar, M.A. Stroscio, M. Meyyappan, D.J. Gosztola, G.P. Wiederrecht, M. Dutta, Nanotechnology 22, 285709 (2011). https://doi.org/10.1088/0957-4484/22/28/285709
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The authors are grateful to Eskişehir Technical University Faculty of Science for XRD and FESEM measurements. The authors would also like to thank Dr. Ferhunde ATAY and Dr. İdris AKYÜZ for the use of PL equipment from Eskişehir Osmangazi University, Department of Physics.
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All authors contributed to the study conception and design. Material preparation, data collection and analysis were performed by Evren Turan, Metin Kul and Seçkin Akın. The first draft of the manuscript was written by Evren Turan and all authors commented on previous versions of the manuscript. All authors read and approved the final manuscript.
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Turan, E., Kul, M. & Akın, S. Structural and optical investigation of spray-deposited SnO2 thin films. J Mater Sci: Mater Electron 33, 15689–15703 (2022). https://doi.org/10.1007/s10854-022-08472-7
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DOI: https://doi.org/10.1007/s10854-022-08472-7