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Tailoring the structural, electrical, and optical features of Erbium(III)-Tris(8-hydroxyquinolinato) nanostructured films for optical applications: effect of film thickness

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Abstract

This paper elaborates on the thickness-dependent structural, optical, and electrical properties of Erbium(III)-Tris-8-hydroxyquinolinato (ErQ3) films. The surface morphology reveals the grains that consolidate to make denser films with increasing film thickness. The ErQ3 grain sizes increased from 80 to 187 nm as the thickness increased from 80 to 190 nm. From XRD analysis, the ErQ3 films are partially crystallized with only one peak at 2θ = 9.80° and a plateau in the range of 20–40°. Electrical measurement of ErQ3 films showed that the electrical conductivity had a strong dependence on film thickness. Transmittance and reflectance measurements showed that the films exhibited a 2.60 eV bandgap, and it does not depend on the thickness of the film. Also, the dispersion of the refractive index was analyzed to determine the essential parameters. The nonlinear optical parameters such as nonlinear refractive index and third-order nonlinear optical susceptibility were calculated by Miller's principles.

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The Authors confirm that the datasets generated during and analyzed during the current study are available from the corresponding author on reasonable request.

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Acknowledgements

The authors extend their appreciation to the Deanship of Scientific Research at the University of Tabuk for funding this work through Research Group RGP-S-1441-69.

Funding

The funded was provided by University of Tabuk, Grant No. (RGP-S-1441-69).

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Authors and Affiliations

  1. Department of Physics, Faculty of Science, University of Tabuk, Tabuk, 71491, Kingdom of Saudi Arabia

    Abdulrhman M. Alsharari, Taymour A. Hamdalla, Naifa S. Alatawi, Marwah Ahmed Alsharif & A. A. A. Darwish

  2. Nanotechnology Research Unit, Faculty of Science, University of Tabuk, Tabuk, 71491, Kingdom of Saudi Arabia

    Abdulrhman M. Alsharari, Taymour A. Hamdalla, Marwah Ahmed Alsharif & A. A. A. Darwish

  3. Department of Physics, Faculty of Science, Zarqa University, Zarqa, 13132, Jordan

    Saleem I. Qashou

  4. Department of Physics, Faculty of Science, University of Alexandria, Alexandria, Egypt

    Taymour A. Hamdalla

  5. Department of Physics, King Fahd University of Petroleum and Minerals, Dhahran, 31261, Kingdom of Saudi Arabia

    Khan Alam

  6. Department of Chemistry, Faculty of Science, University of Tabuk, Tabuk, Kingdom of Saudi Arabia

    Ibrahim A. M. Mihaina

  7. ME-Physics Master Program, Physics Department, Faculty of Science, University of Tabuk, Tabuk, Kingdom of Saudi Arabia

    Hajeer Qaessy

  8. Department of Physics, Faculty of Education, Ain Shams University, Roxy 11757, Cairo, Egypt

    I. S. Yahia

  9. Research Center for Advanced Materials Science (RCAMS), Department of Physics, Faculty of Science, King Khalid University, and Advanced Functional Materials & Optoelectronic Laboratory (AFMOL), King Khalid University, P.O. Box 9004, Abha, Kingdom of Saudi Arabia

    I. S. Yahia

  10. Department of Physics, Faculty of Education et al-Mahweet, Sana’a University, Al-Mahweet, Yemen

    A. A. A. Darwish

Authors
  1. Abdulrhman M. Alsharari
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  2. Saleem I. Qashou
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All authors contributed equally throughout the whole manuscript.

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Correspondence to Taymour A. Hamdalla.

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Alsharari, A.M., Qashou, S.I., Hamdalla, T.A. et al. Tailoring the structural, electrical, and optical features of Erbium(III)-Tris(8-hydroxyquinolinato) nanostructured films for optical applications: effect of film thickness. J Mater Sci: Mater Electron 33, 9966–9975 (2022). https://doi.org/10.1007/s10854-022-07988-2

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