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Electrical properties of La0.72Ca0.28MnO3: Ag0.2 thin films of different deposition time prepared by deposited pulsed laser method

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Abstract

The LCMO: Ag0.2 thin film was grown on the tilted LAO substrate by pulsed laser technology. The structural and electrical properties of the thin film were studied with different deposition times. The X-Ray diffraction analysis demonstrated that all film samples showed exhibit mixed growth and have high crystalline quality. The surface morphology of the films was characterized by atomic force microscopy, and the surface roughness of the films decreased as the deposition time increased. Electrical properties tests show that the peak voltages Up of LIV signals of the films reach their maximum at a deposition time of 10 min, while it also having the TCRmax = 18.43%·K−1. The testing results show that the presence of optimal film thickness can enhance the anisotropic Seebeck coefficient of the film, which in turn improves the film properties.

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Acknowledgements

This work was supported by the National Natural Science Foundation of China (No. 11564021).

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Authors and Affiliations

  1. Faculty of Materials Science and Engineering, Kunming University of Science and Technology, Kunming, 650093, Yunnan, China

    Longfei Qi, Yule Li, Zhiyu Li, Ping Yu, Yingjuan Li, Qingming Chen, Xiang Liu & Hui Zhang

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  1. Longfei Qi
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  2. Yule Li
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Correspondence to Hui Zhang.

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Qi, L., Li, Y., Li, Z. et al. Electrical properties of La0.72Ca0.28MnO3: Ag0.2 thin films of different deposition time prepared by deposited pulsed laser method. J Mater Sci: Mater Electron 32, 22999–23006 (2021). https://doi.org/10.1007/s10854-021-06784-8

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