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Structural and dielectric correlation in nano ZnMn2−xCrxO4

Journal of Materials Science: Materials in Electronics volume 32, pages 19529–19542 (2021)Cite this article

Abstract

Nano ZnMn2−xCrxO4 samples (x = 0, 0.05, 0.15, 0.2) were synthesized by the sol–gel procedure. The synchrotron X-ray diffraction technique was used to investigate the developed phases, cation distributions of different ions between different sites, lattice parameters, and crystallite size upon increasing the amount of Cr doping in nano ZnMn2O4. X-ray photoelectron spectroscopy (XPS) was utilized to explore the cation oxidation state and the elemental composition of the samples. The valence state of the incorporated chromium is determined to be Cr3+ only. The effect of Cr doping, frequency, and temperature on the dielectric constant, dielectric loss, ac conductivity, complex impedance, and modulus was studied in detail. At a low temperature range, the samples exhibited a semiconductor feature, while at a higher temperature range, the samples revealed metallic behavior. Also, the conduction-type mechanism for each doped sample was determined. The activation energy was affected by the amount of Cr doping. A sample with 15% Cr doping has the highest conductivity among the other samples. Also, the effect of doping and temperature on the Nyquist diagram was examined.

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Acknowledgements

The authors acknowledge Taif University Researchers Supporting Project number (TURSP-2020/249), Taif University, Taif, Saudi Arabia.

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Authors and Affiliations

  1. Department of Physics, Faculty of Science, Ain Shams University, Cairo, 11566, Egypt

    Zein K. Heiba, Mohamed Bakr Mohamed, M. M. Ghannam & A. M. El-naggar

  2. Physics Department, Faculty of Science, Taibah University, Medina, Saudi Arabia

    Mohamed Bakr Mohamed

  3. Physics & Astronomy Department, College of Science, King Saud University, P.O. Box 2455, Riyadh, 11451, Saudi Arabia

    A. M. El-naggar

  4. Department of Physics, College of Science, Taif University, P.O. Box 11099, Taif, 21944, Saudi Arabia

    Y. Altowairqi

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  1. Zein K. Heiba
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  2. Mohamed Bakr Mohamed
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  4. A. M. El-naggar
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Correspondence to Mohamed Bakr Mohamed.

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Heiba, Z.K., Mohamed, M.B., Ghannam, M.M. et al. Structural and dielectric correlation in nano ZnMn2−xCrxO4. J Mater Sci: Mater Electron 32, 19529–19542 (2021). https://doi.org/10.1007/s10854-021-06472-7

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  • DOI: https://doi.org/10.1007/s10854-021-06472-7