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Growth and characterization of hydrophobic anti-reflection CaF2 films

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Abstract

CaF2 films of thicknesses in the range of 50–200 nm were deposited by thermal evaporation on glass substrates. A series of CaF2 films were also grown by oblique angle deposition in which the orientation of the substrate with the horizontal direction was varied from 0° to 75°. CaF2 films are crystalline and show X-ray reflections corresponding to (111), (220), and (311) crystal planes of the cubic phase. The surface morphology of the films was analyzed by atomic force microscopy and it is found that surface roughness increases with an increase in the deposition angle. The water contact angle studies on CaF2 films show that the wettability properties of the films depend on the film thickness and hydrophobicity enhances with the angled deposition. Optical studies found that CaF2 films have high transmittance (> 85%) and good anti-reflection properties in the wavelength range of 400–1000 nm. The study shows that the anti-reflection and hydrophobic properties of CaF2 films can be modified by the oblique angle thermal evaporation.

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Acknowledgements

Atul Khanna thanks Council of Scientific and Industrial Research (CSIR), New Delhi, India for research grants. Ravish Kumar Jain thanks University Grant Commission (UGC), New Delhi, India. Jatinder Kaur thanks CSIR for research fellowship grants.

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  1. Sensors and Glass Physics Laboratory, Department of Physics, Guru Nanak Dev University, Amirtsar, Punjab, 143005, India

    Ravish K. Jain, Jatinder Kaur & Atul Khanna

  2. Department of Physics, University of Petroleum and Energy Studies, Dehradun, Uttarakhand, 248007, India

    Amit K. Chawla

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Jain, R.K., Kaur, J., Khanna, A. et al. Growth and characterization of hydrophobic anti-reflection CaF2 films. J Mater Sci: Mater Electron 31, 14241–14248 (2020). https://doi.org/10.1007/s10854-020-03980-w

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