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Effect of swift heavy 86Kr30+ ions irradiation on optical and electrical properties of p-type transparent Ni-doped CuAlO2 films

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Abstract

Swift heavy ion (SHI) irradiation is an effective approach to modulate the structure, optical and electrical properties of semiconductors. Herein, we present the influence of 86Kr30+ ions irradiation on optical and electrical properties of p-type transparent oxide semiconductor Ni-doped CuAlO2 films prepared by sol–gel method. The results reveal that Ni-doping inhibits the amorphization of CuAlO2 films during swift heavy ions irradiation and decreases the surface roughness of SHI-irradiated Ni-doped CuAlO2 films. However, SHI-irradiated Ni-doped CuAlO2 films exhibit higher optical transmittance (74%) and lower electrical resistivity (11.5 Ω cm), which corresponds to a decrease of two orders of magnitude due to the generation of a large number of carriers. In addition, SHI-irradiated Ni-doped CuAlO2 film renders photosensitive behavior and a reduced electrical resistivity of 7.4 Ω cm is achieved under UV illumination. The superior optical and electrical properties of SHI-irradiated Ni-doped CuAlO2 films can be ascribed to the thermal spike effect of high-energy ions.

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Acknowledgements

The authors thank National Natural Science Foundation of China (Grants Nos. 61874166, U1832149), and Natural Science Foundation of Gansu province (18JR3RA292).

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  1. Key Laboratory of Special Function Materials and Structure Design, Ministry of Education, School of Physical Science and Technology, Lanzhou University, Lanzhou, 730000, People’s Republic of China

    Lingxiao Ma, Chenhao Dong, Wei Lan & Erqing Xie

  2. Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou, 730000, People’s Republic of China

    Dayu Yin

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Correspondence to Wei Lan.

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Ma, L., Yin, D., Dong, C. et al. Effect of swift heavy 86Kr30+ ions irradiation on optical and electrical properties of p-type transparent Ni-doped CuAlO2 films. J Mater Sci: Mater Electron 31, 2130–2138 (2020). https://doi.org/10.1007/s10854-019-02734-7

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