Abstract
A modified spray pyrolysis technique was employed for the deposition of Cu2CoSnS4 (CCTS) thin films. X-ray diffraction study showed that the CCTS thin films exhibit stannite structure with preferred orientation along (112) plane. The phase purity of sprayed CCTS films was confirmed from Raman analysis, as the most intense peak is observed at 320 cm−1 corresponding to A1 mode. With increase in substrate temperature the grains over the surface of the CCTS films become more distinct. The EDAX spectrum revealed the presence of different constituent elements such as, Cu, Co, Sn and S for the films deposited at 325 °C. The optical absorption study showed that the energy band gap values of the CCTS films are decreasing from 1.70 to 1.46 eV with respect to increase in substrate temperature from 275 to 325 °C.
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Change history
07 October 2017
The original version of this article unfortunately contained an error in Sect. 3.3 Structural analysis Equation (7). The corrected version is published with this erratum (Eq. 7).
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Authors wish to acknowledge “CENTRAL SURFACE ANALYTICAL FACILITY of IIT Bombay” for providing the SEM Images.
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Maldar, P.S., Mane, A.A., Nikam, S.S. et al. Temperature dependent properties of spray deposited Cu2CoSnS4 (CCTS) thin films. J Mater Sci: Mater Electron 28, 18891–18896 (2017). https://doi.org/10.1007/s10854-017-7842-1
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DOI: https://doi.org/10.1007/s10854-017-7842-1