Skip to main content

Static fatigue lifetime of optical fibers assessed using Boltzmann–Arrhenius–Zhurkov (BAZ) model

Abstract

The recently suggested probabilistic design-for-reliability (PDfR) concept and particularly its physically meaningful and flexible Boltzmann–Arrhenius–Zhurkov (BAZ) model, can be effectively employed as an attractive replacement of the widely used today purely empirical and physically unsubstantiated power law relationship for assessing the static fatigue (delayed fracture) lifetime of optical silica fibers. In this analysis the BAZ model is employed to estimate the static fatigue lifetime of an optical silica fiber under the combined action of tensile loading and an elevated temperature. The PDfR concept has its experimental basis in the highly-focused and highly-cost-effective failure-oriented accelerated testing (FOAT). Accordingly, it is shown how the PDfR concept, BAZ model and FOAT data can be effectively used, when there is a need to assess the long-term tensile strength (static fatigue life) of a coated optical fiber subjected to the combined action of tensile loading and elevated temperature. Although the role of elevated humidity might be insignificant owing to the elevated temperature conditions, this role can be accounted for, if there is a need for that, as well, by using multi-parametric BAZ model. Since the principle of superposition does not work in reliability engineering, all the three stressors, namely, the elevated temperature, tensile stress and relative humidity, should be applied concurrently to the specimen under test, and their coupling, if any, should and could be considered by the FOAT based on the BAZ model. The numerical example is carried out, however, for the case when only the elevated temperature and tensile stress are applied. The results of the analysis can be employed in the design and testing of optical silica fibers.

This is a preview of subscription content, access via your institution.

References

  1. E. Suhir, Assuring aerospace electronics and photonics reliability: what could and should be done differently, IEEE Aerospace Conference, Big Sky, Montana (2013)

  2. E. Suhir, When reliability is imperative, ability to quantify it is a must. IMAPS Adv. Microelectr. (2012)

  3. E. Suhir, Applied Probability for Engineers and Scientists. (McGraw-Hill, New York, 1997)

    Google Scholar 

  4. E. Suhir, Probabilistic design for reliability. Chip Scale Rev. 14(6) (2010)

  5. E. Suhir, R. Mahajan, A. Lucero, L. Bechou, Probabilistic design for reliability (PDfR) and a novel approach to qualification testing (QT), 2012 IEEE/AIAA Aerospace Conf., Big Sky, Montana (2012)

  6. E. Suhir, Accelerated life testing (ALT) in microelectronics and photonics: its role, attributes, challenges, pitfalls, and interaction with qualification tests. Keynote address at the SPIE’s 7-th Annual Int. Symp. on Nondestructive Eval. for Health Monitoring and Diagnostics, 17–21 March, San Diego, CA (2002)

  7. E. Suhir, Reliability and accelerated life testing. Semicond. Int. (2005)

  8. E. Suhir, Statistics- and reliability-physics-related failure processes. Mod. Phys. Lett. B (MPLB) 28(13), (2014)

  9. E. Suhir, Analysis of a pre-stressed bi-material accelerated life test (ALT) specimen. Zeitschrift fur Angewandte Mathematik und Mechanik. (ZAMM) 91(5) (2011)

  10. E. Suhir, R. Ghaffarian, S. Yi, Solder material experiencing low temperature stress and random vibration loading: predicted remaining useful lifetime. J. Mat. Sci. (2017) in print

  11. E. Suhir, Predictive modeling is a powerful means to prevent thermal stress failures in electronics and photonics. Chip Scale Rev. 15(4) (2011)

  12. E. Suhir, Thermal stress failures in electronics and photonics: physics, modeling prevention. J. Thermal Stresses 36(6), 537–563 (2013)

  13. E. Suhir, Analytical thermal stress modeling in electronic and photonic systems. ASME Appl. Mech. Rev. 62(4), 040801 (2009)

    Article  Google Scholar 

  14. <<bib id="bib14">E. Suhir, Analytical stress-strain modeling in photonics engineering: its role, attributes and interaction with the finite-element method. Laser Focus World 14, 611–615 (2002)

    Google Scholar 

  15. S.N. Zhurkov, Kinetic concept of the strength of solids. Int. J. Fract. Mech. 1(4), 40 (1965)

  16. E. Suhir, S. Kang, Boltzmann-Arrhenius-Zhurkov (BAZ) model in physics-of-materials problems. Mod. Phys. Lett. B (MPLB) 27, 130009 (2013)

    Google Scholar 

  17. E. Suhir, R. Ghaffarian, S. Yi, Solder material experiencing low temperature inelastic stress and random vibration loading: predicted remaining useful lifetime, J. Mater. Sci. (2017) in print

  18. R.E. Setchell, Reduction in fiber damage thresholds due to static fatigue. Proc. SPIE 2428, 54–65 (1995)

    Article  Google Scholar 

  19. L. Huang, R.S. Dyer, R.J. Lago, A.A. Stolov, J. Li, Mechanical properties of polyimide coated optical fibers at elevated temperatures. Proc. SPIE 9702. XVI, 97020Y (2016) doi:10.1117/12.2210957

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to E. Suhir.

Rights and permissions

Reprints and Permissions

About this article

Verify currency and authenticity via CrossMark

Cite this article

Suhir, E. Static fatigue lifetime of optical fibers assessed using Boltzmann–Arrhenius–Zhurkov (BAZ) model. J Mater Sci: Mater Electron 28, 11689–11694 (2017). https://doi.org/10.1007/s10854-017-6972-9

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s10854-017-6972-9

Keywords

  • Sensitivity Factor
  • Effective Activation Energy
  • Silica Fiber
  • Photonic Product
  • Remain Useful Life