Abstract
Power electronics modules in electric vehicles and hybrid electric vehicles, particularly those containing next-generation power semiconductor devices such as silicon carbide and gallium nitride are operated at high temperatures exceeding 200 °C. Consequently, the reliability requirements for such modules have become highly stringent and new packaging materials and technologies are required to meet the demands of power electronic modules. Some good candidates for high temperature applications include high-temperature solders such as Au–20Sn, Ag or Cu sinter pastes, and transient liquid phase (TLP) bonding materials. In particular, the TLP bonding technology is suitable for use in high temperature environments owing to its low cost and simplicity of the bonding process. In this study, the feasibility of Cu–Sn and Ni–Sn TLP bonding technologies as die-attach methods for power electronics packaging applications is examined. The results of the study indicate that the Cu–Sn and Ni–Sn TLP bonding processes transform the joints fully into Cu6Sn5/Cu3Sn and Ni3Sn4 intermetallic compounds (IMCs), respectively. Further, the mechanical strength and reliability of the two TLP bonding joints are reduced owing to the formation of brittle IMCs.
This is a preview of subscription content,
to check access.






References
Y. Wang, S. Jones, A. Dai, G. Liu, Microelectron. Reliab. 54, 1911–1915 (2014)
A. Ibrahim, J.P. Ousten, R. Lallemand, Z. Khatir, Microelectron. Reliab. 58, 204–210 (2016)
F.P. McCluskey, M. Dash, Z. Wang, D. Huff, Microelectron. Reliab. 46, 1910–1914 (2006)
Z. Liang, IEEE Power Electronics Society, in Proceedings of International Symposium on Power Semiconductor Devices and ICs (ISPSD) (2012), pp. 325–331
C. Buttay, D. Planson, B. Allard, D. Bergogne, P. Bevilacqua, C. Joubert, M. Lazar, C. Martin, H. Morel, D. Tournier, C. Raynaud, Mater. Sci. Eng. B 176, 283–288 (2011)
H. Ji, M. Li, S. Ma, M. Li, Mater. Des. 108, 590–596 (2016)
S. Anhock, H. Oppermann, C. Kallmayer, R. Aschenbrenner, L. Thomas, H. Reichl, in Proceedings of IEEE Electronics Manufacturing Technology Symposium (1998), pp. 156–165
Y.C. Liu, J.W.R. Teo, S.K. Tung, K.H. Lam, J. Alloys Compd. 448, 340–343 (2008)
J.W. Yoon, H.S. Chun, S.B. Jung, J. Alloys Compd. 469, 108–115 (2009)
G.S. Matijasevic, C.C. Lee, C.Y. Wang, Thin Solid Films 223, 276–287 (1993)
C. Gobl, J. Faltenbacher, in Proceedings of the 6th International Conference on IEEE Integrated Power Electronics Systems (CIPS) (2010), pp. 1–5
T.G. Lei, J.N. Calata, G.Q.L.X. Chen, S. Luo, IEEE Trans. Comp. Pack. Technol. 33, 98–104 (2010)
M. Knoerr, A. Schletz, in Proceedings of the 6th International Conference on IEEE Integrated Power Electronics Systems (CIPS) (2010), pp. 1–6
S.W. Yoon, M.D. Glover, K. Shiozaki, IEEE Trans. Power Electron 28, 2448–2456 (2013)
T.A. Tollefsen, A. Larsson, O.M. Lovvik, K.E. Aasmundtveit, IEEE Trans. Compon. Pack. Manuf. Technol. 3, 904–914 (2013)
S.W. Yoon, K. Shiozaki, S. Yasuda, M.D. Glover, in Proceedings of the IEEE Applied Power Electronics Conference and Exposition (APEC) (2012), pp. 478–482
ASTM D1002-10, Standard test method for apparent shear strength of single-lap-joint adhesively bonded metal specimens by tension loading (Metal-to-Metal), ASTM International, West Conshohocken, PA (2010)
J.W. Yoon, S.B. Jung, J. Alloys Compd. 376, 105–110 (2004)
K. Zeng, K.N. Tu, Mater. Sci. Eng. R 38, 55–105 (2002)
H.S. Chun, J.W. Yoon, S.B. Jung, J. Alloys Compd. 439, 91–96 (2007)
H.B. Kang, J.H. Bae, J.W. Yoon, S.B. Jung, J.W. Park, C.W. Yang, Scripta Mater. 63, 1108–1111 (2010)
J.W. Yoon, S.W. Kim, S.B. Jung, Mater. Trans. 45, 727–733 (2004)
Y.C. Chan, A.C.K. So, J.K.L. Lai, Mater. Sci. Eng. B 55, 5–13 (1998)
P.L. Tu, Y.C. Chan, K.C. Hung, J.K.L. Lai, Scripta Mater. 44, 317–323 (2001)
R.E. Pratt, E.I. Stromswold, D.J. Quesnel, IEEE Trans. Compon. Pack. Manuf. Technol 19, 134–141 (1996)
C.C. Lee, P.J. Wang, J.S. Kim, in Proceedings of the 57th International Conference on Electronic Components and Technology Conference (ECTC) (2007), pp. 648–652
N. Hoivik, H. Liu, K. Wang, G. Salomonsen, K. Aasmundtveit, in Advanced Materials and Technologies for Micro/Nano-Devices, Sensors and Actuators, ed. by E. Gusev, E. Garfunkel, A. Dideikin (Springer, Dordrecht, 2010), p. 189
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Lee, BS., Hyun, SK. & Yoon, JW. Cu–Sn and Ni–Sn transient liquid phase bonding for die-attach technology applications in high-temperature power electronics packaging. J Mater Sci: Mater Electron 28, 7827–7833 (2017). https://doi.org/10.1007/s10854-017-6479-4
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s10854-017-6479-4