Abstract
Diluted magnetic semiconductor Ge1−xVx with three different dopant concentrations x = 0.03, 0.06 and 0.09 has been grown using melt growth technique. Scanning electron microscopy was used to analyze the surface morphological nature of the samples. Magnetic measurements taken using vibrating sample magnetometer reveal the diamagnetic nature for x = 0.03 and antiferromagnetic for x = 0.06 and 0.09. Powder X-ray diffraction data sets were collected for the samples and the structure was analysed using profile refinement technique and charge density was analysed using the versatile statistical tool maximum entropy method. Charge density analysis reveals that when x = 0.06 and 0.09 the system exhibits covalent bonding and picturises the signature of antiferromagnetism. The local structure was analyzed using pair distribution function technique.
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References
Z. Wilamowski, A.M. Werpachowska, Mater. Sci. Poland 24, 3 (2006)
H. Munekata, H. Ohno, S. von Molnar, A. Segmuller, L.L. Chang, L. Esaki, Phys. Rev. Lett. 63, 1849 (1989)
H. Ohno, A. Shen, F. Matsukura, A. Oiwa, A. Endo, S. Katsumoto, Y. Iye, Appl. Phys. Lett. 69, 363 (1996)
T. Dietl, H. Ohno, F. Matsukura, J. Cibert, D. Ferrand, Science 287, 1019 (2000)
Y.D. Park, A.T. Hanbicki, S.C. Erwin, C.S. Hellberg, J.M. Sullivan, J.E. Mattson, T.F. Ambrose, A. Wilson, G. Spanos, B.T. Jonker, Science 295, 651 (2002)
M.A. Borek, S. Oktyabrsky, M.O. Aboelfotoh, J. Narayan, Appl. Phys. Lett. 69, 3560 (1996)
S. Choi, H.C. Hong, S. Cho, Y. Kim, J.B. Ketterson, C.U. Jung, K. Rhie, B.J. Kim, Y.C. Kim, J. Appl. Phys. 93, 7670 (2003)
M.M. Otrokov, V.V. Tugushev, A. Ernst, S.A. Ostanin, V.M. Kuznetsov, E.V. Chulkov, J. Exp. Theor. Phys. 112(4), 625 (2011)
X.H. Zhou, X.S. Chen, X.G. Guo, L.Z. Sun, Y.L. Sun, W. Lu, J. Mag, Mag. Mater. 284, 253 (2004)
A.W. Overhauser, J. Phys. Chem. Solids 13, 71 (1960)
E.W. Hart, Phys. Rev. 106, 467 (1957)
K. Yosida, Phys. Rev. 106, 893 (1957)
S. Saravanakumar, M. Pattammal, S. Israel, R.A.J.R. Sheeba, R. Saravanan, Phys. B 407, 302 (2012)
H.M. Rietveld, J. Appl. Cryst. 2, 65 (1969)
V. Petříček, M. Dušek, L. Palatinus, The Crystallographic Computing System (Institute of Physics, Academy of Sciences of the Czech Republic, Praha, 2000)
D.M. Collins, Nature 49, 298 (1982)
K.S. Syed Ali, R. Saravanan, S. Israel, M. Açıkgöz, L. Arda, Phys. B 405, 1763 (2010)
D. Ruben, I. Fujio: Super-fast program PRIMA for the maximum-entropy method, Advanced materials Laboratory, National Institute for Materials Science, Ibaraki, Japan 3050044 (2004)
F. Izumi, R.A. Dilanian, Recent Research Developments in Physics, Part II, 3, Transworld (Research Network, Trivandrum, 2002), pp. 699–726
K. Momma, F. Izumi, J. Appl. Crystallogr. 41, 653 (2008)
T. Proffen, S.J.L. Billinge, J. Appl. Crystallogr. 32, 572 (1999)
K. Jeong, J. Thompson, T. Proffen, A. Perez, S.J.L. Billinge, PDFGetX, a program for obtaining the atomic pair distribution function from X-ray powder diffraction data (2001)
C.L. Farrow, P. Juhas, J.W. Liu, D. Bryndin, E.S. Bozin, J. Bloch, T. Proffen, S.J.L. Billinge, J. Phys. Condens. Matter. Phys. 19, 335219 (2007)
J.L.B. Bochu: GRETEP, Domaine universitaire BP 46, 38402 Saint Martin d’Hères. http:www.inpg.fr/LMGP
Acknowledgments
We thank the Council of Scientific and Industrial Research (CSIR) for its financial assistance to the research Project No. 03(1138)/09/EMR-II. We thank the authorities of The Madura College, Madurai, for their support. We acknowledge National Institute for Interdisciplinary Science & Technology (NIIST), Trivandrum, for their help in the collection of X-ray diffraction data. We acknowledge Central Instrumentation Facility, Pondicherry University, Pondicherry, for their help in the magnetic measurements using VSM.
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Sheeba, R.A.J.R., Saravanan, R. & Berchmans, L.J. Signature of antiferromagnetism in entropy maximized charge density distribution of melt grown diluted magnetic semiconductor Ge1−xVx . J Mater Sci: Mater Electron 26, 3772–3780 (2015). https://doi.org/10.1007/s10854-015-2901-y
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DOI: https://doi.org/10.1007/s10854-015-2901-y