Skip to main content
Log in

Investigation of copper plated-through-holes in glass fiber reinforced epoxy substrates using AC impedance spectroscopy

  • Published:
Journal of Materials Science: Materials in Electronics Aims and scope Submit manuscript

Abstract

AC impedance spectroscopy was used to investigate copper plated-through-holes (PTH) in glass fiber reinforced epoxy substrates (FR4) at different stages of temperature-humidity-bias driven electrochemical migration failure. The test vehicles consisted of PTHs arranged in an alternate anode and cathode configuration in FR4 boards. The test vehicles were subjected to accelerated stress testing [130 °C, 85 % relative humidity (RH) and 100 V DC] to initiate a specific sub-surface electrochemical failure mode referred to as conductive anodic filament (CAF) formation. The test vehicle variations included a control with no exposure, test vehicle with electrical insulation failure (resistance change to 1 MΩ during the test) and test vehicle with initiation of CAF to compare the impedance characteristics at different stages of electrochemical migration failure. AC impedance measurements were carried out on the test vehicle variations at ambient and in an in situ humidity chamber as a function of RH at 14–85 %. The prior exposure condition of the test vehicles was found to have a strong effect on the impedance characteristics at different RH values. The accelerated testing results and impedance characteristics of the PTHs in epoxy-glass fiber substrates are discussed.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Fig. 1
Fig. 2
Fig. 3
Fig. 4
Fig. 5
Fig. 6
Fig. 7
Fig. 8
Fig. 9
Fig. 10

Similar content being viewed by others

References

  1. B. Sood, M. Pecht, J. Mater. Sci. Mater. El. 22, 1602 (2011)

    Article  Google Scholar 

  2. K. Ramachandran, F. Liu, P.M. Raj, V. Sundaram, R. Tummala, J. Electron. Mater. 42, 348 (2013)

    Article  Google Scholar 

  3. K. Ramachandran, F. Liu, V. Sundaram, R. Tummala, IEEE Trans. Compon. Packaging Manuf. Technol. 3, 282 (2013)

    Article  Google Scholar 

  4. C. Cohn, H. Kimbara, Electronics packaging technology conference (2007), p. 86

  5. P.J. Boddy, R.H. Delaney, J.N. Lahti, E.F. Landry, R.C. Restrick. 14th Annual IEEE reliability physics symposium (1976), p. 108

  6. J.N. Lathi, R.H. Delaney, J.N. Hines, 17th Annual proceedings of reliability physics (1979), p. 39

  7. D.J. Lando, J.P. Mitchell, T.L. Welsher, 17th Annual proceeding of reliability physics (1979), p. 51

  8. K. Ramachandran, W.J. Ready, P.M. Raj, V. Sundaram, R. Tummala, J. Mater. Sci. Mater. El. 25, 1687 (2014)

    Article  Google Scholar 

  9. W.J. Ready, L.J. Turbini, J. Electron. Mater. 31, 1208 (2002)

    Article  Google Scholar 

  10. W.J. Ready, Ph.D. Thesis in Materials Science and Engineering, Georgia Institute of Technology (Atlanta, GA, 2000)

  11. A. Caputo, L.J. Turbini, D.D. Perovic, J. Electron. Mater. 39, 85 (2010)

    Article  Google Scholar 

  12. A. Caputo, L.J. Turbini, D.D. Perovic, J. Electron. Mater. 39, 92 (2010)

    Article  Google Scholar 

  13. A. Caputo, L.J. Turbini, D.D. Perovic, J. Electron. Mater. 40, 1884 (2011)

    Article  Google Scholar 

  14. L.J. Turbini, W.R. Bent, W.J. Ready, J. Surf. Mt. Technol. 13, 10 (2000)

    Google Scholar 

  15. IPC-TM-650 2.6.25, Conductive anodic filament (CAF) resistance test: X–Y axis (The institute for interconnecting and packaging, electronic circuits, IPC, Northbrook, 2003)

    Google Scholar 

  16. K.M. Takahashi, J. Electrochem. Soc. 138(6), 1587 (1991)

    Article  Google Scholar 

  17. J.R. White, IBM J. Res. Dev. 37(2), 243 (1993)

    Article  Google Scholar 

  18. L.J. Turbini, Circuit World 23, 20 (1997)

    Article  Google Scholar 

  19. A. Wexler, in CRC Handbook of Chemistry and Physics, 89th edn (Internet Version 2009), ed. by D.R. Lide (CRC Press/Taylor and Francis, Boca Rotan, FL, 2009), pp. 15–33

  20. R.A. Gerhardt, Encyclopedia of condensed matter physics (Elsevier Press, Amsterdam, 2005), pp. 350–363

    Book  Google Scholar 

  21. W.J. Ready, L.J. Turbini, R. Nickel, J. Fischer, J. Electron. Mater. 28, 1158 (1999)

    Article  Google Scholar 

  22. R. Gerhardt, J. Phys. Chem. Solids 55, 1491 (1994)

    Article  Google Scholar 

Download references

Acknowledgments

The authors would like to thank the faculty and staff at the 3D Systems Packaging Research Center, Georgia Tech for their valuable suggestions and assistance with this study.

Conflict of interest

The authors declare that they have no conflict of interest.

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Koushik Ramachandran.

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Ramachandran, K., Pruyn, T.L., Huang, T. et al. Investigation of copper plated-through-holes in glass fiber reinforced epoxy substrates using AC impedance spectroscopy. J Mater Sci: Mater Electron 26, 2563–2570 (2015). https://doi.org/10.1007/s10854-015-2723-y

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s10854-015-2723-y

Keywords

Navigation