Abstract
The effect of B2O3 on the microstructure and microwave dielectric properties of the 0.4Nd0.96Yb0.04(Mg0.5Sn0.5)O3–0.6Ca0.8Sr0.2TiO3 ceramic system were investigated with a view to their use in microwave devices. A B2O3-doped 0.4Nd0.96Yb0.04(Mg0.5Sn0.5)O3–0.6Ca0.8Sr0.2TiO3 ceramic system was prepared by the conventional solid-state method. The X-ray diffraction patterns of the B2O3-doped 0.4Nd0.96Yb0.04(Mg0.5Sn0.5)O3–0.6Ca0.8Sr0.2TiO3 ceramic system did not significantly vary with sintering temperature. A 1.25 wt% B2O3-doped 0.4Nd0.96Yb0.04(Mg0.5Sn0.5)O3–0.6Ca0.8Sr0.2TiO3 ceramic system that was sintered at 1,525 °C for 4 h had a dielectric constant of 38.0, a quality factor (Q × f) of 68,600 GHz, and a temperature coefficient of resonant frequency of 2 ppm/°C.
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Acknowledgments
This work was supported by the National Science Council in Taiwan under Grant NSC 102-2622-E-262-009-CC3.
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Chen, YC., Fu, JY., Li, CH. et al. Influence of B2O3 on microstructure and microwave dielectric properties of 0.4Nd0.96Yb0.04(Mg0.5Sn0.5)O3–0.6Ca0.8Sr0.2TiO3 ceramic system. J Mater Sci: Mater Electron 25, 4760–4766 (2014). https://doi.org/10.1007/s10854-014-2230-6
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DOI: https://doi.org/10.1007/s10854-014-2230-6