Abstract
In this work, we report a study of the evolution of Cu–In–Ga–Se system during selenization. The metallic precursors were selenized in Se vapour atmosphere at temperature range from 210 to 380 °C. Scanning electron microscopy, transmission electron microscopy, X-ray diffraction, Raman spectra were used to investigate morphological and structural properties of the films. A great amount of thin platelets appeared in the film surfaces at temperature range from 210 to 270 °C. Most platelets had hexagon or polygon structures. The average sizes of these platelets increased with the temperatures. TEM analyses indicated that these platelets had γ-CuSe phases. Beyond 310 °C, most of CuSe platelets decomposed under release of selenium and formed Cu2−xSe. Cu2−xSe might react with InSe for the formation of tetragonal CuInSe2. The average grain sizes increased obviously with the increased temperatures. A possible reaction path to obtain a chalcopyrite structural film was discussed in the end. In addition, Ga was detected rich in the bottom of the film by energy dispersive spectroscopy and grazing incidence X-ray diffraction.
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References
T. Nakada, Electron. Mater. Lett. 8, 179 (2012)
J. Kaneshiro, N. Gaillard et al., Sol. Energy Mater. Sol. Cells 94, 12 (2010)
S.Y. Kim, J.H. Kim, J. Korean Phys. Soc. 60, 2018 (2012)
P. Jackson, D. Hariskos et al., Prog. Photovolt Res. Appl. 19, 894 (2011)
T.J. Gillespie, C.H. Marshall, Sol. Energy Mater. Sol. Cells 59, 27 (1999)
C.J. Hibberd, E. Chassaing et al., Prog. Photovolt Res. Appl. 18, 434 (2010)
C.H. Shen, Y.C. Lin, J. Mater. Sci. Mater. Electron. 24, 2906 (2013)
J.K. Sim, K. Ashok et al., Met. Mater. Int. 19, 303 (2013)
F.B. Dejene, Curr. Appl. Phys. 10, 36 (2010)
S. Niki, M. Contreras et al., Prog. Photovolt Res. Appl. 18, 453 (2010)
D. Wolf, G. MuÈller, Thin Solid Films 361–362, 155 (2000)
S. Ishizuka, H. Shibata et al., Appl. Phys. Lett. 91, 041902 (2007)
R. Klenk, T. Walter et al., Adv. Mater. 5, 114 (1993)
J. Liu, A.X. Wei et al., J. Mater. Sci. Mater. Electron. 24, 2553 (2013)
N.H. Kim, S. Oh et al., J. Korean Phys. Soc. 61, 1177 (2012)
F. Hergert, S. Jost et al., Part. Part. Syst. Charact. 22, 423 (2005)
S. Han, F. Hasoon et al., J. Phys. Chem. Solids 66, 1895 (2005)
T.P. Hsieh, C.C. Chuang et al., Solid-State Electron. 56, 175 (2011)
C. Liao, J. Han, K. Zhao et al., Chin. J. Inorg. Chem. 27, 1 (2011)
C. Liao, J. Han, K. Zhao et al., Acta Phys. Chim. Sin. 27, 432 (2011)
W. Witte, R. Kniese et al., Thin Solid Films 517, 867 (2008)
K.H. Liao, C.Y. Sua et al., Appl. Surf. Sci. 263, 476 (2012)
T. Mise, T. Nakada, Sol. Energy Mater. Sol. Cells 93, 1000 (2009)
A. Gobeaut, L. Laffont, J.M. Tarascon et al., Thin Solid Films 517, 4436 (2009)
S. Schleussner, U. Zimmermann et al., Sol. Energy Mater. Sol. Cells 95, 721 (2011)
Acknowledgments
The authors want to thank Zhang Hui-zhen for sample preparation and analysis by FESEM. The presented results were supported by the Beijing Ministerium for the science project under contract no.H030630010120.
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Han, Jf., Liao, C., Jiang, T. et al. Investigation of chalcopyrite film growth: an evolution of thin film morphology and structure during selenization. J Mater Sci: Mater Electron 24, 4636–4642 (2013). https://doi.org/10.1007/s10854-013-1455-0
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DOI: https://doi.org/10.1007/s10854-013-1455-0