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Microstructure modification of La2Zr2O7 buffer films for coated conductors by metal organic decomposition

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Abstract

La2Zr2O7 (LZO) film directly deposited on Ni-5 at.%W by a chemical solution technique, metal organic decomposition (MOD), indicated a poor texture characteristic, which would result in high-angle grain boundaries in subsequent YBa2Cu3O7−δ (YBCO) associated with weak-link behavior. Different ultrathin MOD-LZO, Y2O3, and CeO2 seed layers (~several nanometers) with various annealing temperature were inserted to improve the crystallographic alignment. The relation between the texture and annealing temperature was systematically investigated. A CeO2 seed layer allows us to grow high quality LZO epitaxial films with values of full width at half-maximum around 5.61° and 5.13° for the Φ-scan of (222) and rocking curve of (400) LZO, respectively, which is comparable to the microstructure of films grown using physical vapor deposited Y2O3 as a seed layer. This buffer template, serving for YBCO coated conductors, could potentially decrease the overall fabrication cost.

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Acknowledgments

We gratefully acknowledge the support of 863 High-Tech Project (No. 2009AA03Z201) and the National Science Foundation of China under Grant No. 50902017 for this work.

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Authors and Affiliations

  1. State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, 610054, People’s Republic of China

    Jie Xiong, Xibin Wang, Pei Guo, Fei Zhang, Yudong Xia, Cong Zhu, Pengju Xu, Xiaohui Zhao & Bowan Tao

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  1. Jie Xiong
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  2. Xibin Wang
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  3. Pei Guo
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  4. Fei Zhang
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  5. Yudong Xia
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  6. Cong Zhu
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  7. Pengju Xu
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  8. Xiaohui Zhao
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Correspondence to Jie Xiong or Xibin Wang.

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Xiong, J., Wang, X., Guo, P. et al. Microstructure modification of La2Zr2O7 buffer films for coated conductors by metal organic decomposition. J Mater Sci: Mater Electron 24, 1546–1550 (2013). https://doi.org/10.1007/s10854-012-0968-2

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  • DOI: https://doi.org/10.1007/s10854-012-0968-2

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