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Improved characteristics of sprayed CdO films by rapid thermal annealing

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Abstract

We report the influence of rapid thermal annealing (RTA) on optical, electrical and structural properties of sprayed undoped CdO thin films. XRD investigation revealed that as-grown films are polycrystalline in nature with cubic structure; and pronounced improvement in crystallinity of the films have been noticed after annealing. RTA-treated films showed preferred orientation in the (2 0 0) direction. The optical band gap was deduced from transmittance data for as-grown and annealed films and found to be 2.51 eV for as-grown film and ranged between 2.25 and 2.48 eV for annealed films. Figure of merit was calculated and found its maximum value (1.2 × 10−2 Ω−1) was for film annealed with of 6 min. Thermoelectric power (TEP) measurements revealed that the CdO films are having n-type conductivity. Furthermore, the activation energy was calculated for films from TEP data. The lowest electrical resistivity was found to be 6 × 10−4 Ω cm for CdO film annealed with time ≥6 min. The observed changes demonstrated that RTA is a viable technique for improving characteristics of sprayed CdO films.

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  1. School of Applied Science, University of Technology, Ministry of Science and Technology, Baghdad, Iraq

    Raid A. Ismail

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  1. Raid A. Ismail
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Ismail, R.A. Improved characteristics of sprayed CdO films by rapid thermal annealing. J Mater Sci: Mater Electron 20, 1219–1224 (2009). https://doi.org/10.1007/s10854-009-9855-x

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  • DOI: https://doi.org/10.1007/s10854-009-9855-x

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