Abstract
In the present study, feasibility of using SnO2 as reinforcement in Sn-3.5Ag is assessed. Energy-efficient microwave assisted powder metallurgy route was used for synthesis of materials. Characterization results revealed that best combination of hardness and tensile strength was realized with 0.7 vol% of SnO2 in solder matrix. An attempt is made to correlate mechanical properties of Sn-3.5Ag with the increasing presence of SnO2 particulates at the nanometer length scale.
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References
P.T. Vianco, D.R. Frear, JOM 7, 14 (1993)
S. Kang, A. Sarkhel, JOM 23, 701 (1994)
J. Glazer, J. Electron. Mater. 23, 693 (1994). doi:10.1007/BF02651361
E.P. Wood, K.L. Nimmo, J. Electron. Mater. 23, 709 (1994). doi:10.1007/BF02651363
P. Babaghorbani, M. Gupta, J. Electron. Mater. 37(6), 860 (2008). doi:10.1007/s11664-008-0399-2
M. Abtew, G. Selvaduray, Mater. Sci. Eng. 27, 95 (2000). doi:10.1016/S0927-796X(00)00010-3
X. Deng, N. Chawla, K.K. Chawla, M. Koopman, Acta Mater. 52, 4291 (2004). doi:10.1016/j.actamat.2004.05.046
D.R. Frear, P.T. Vianco, Metall. Mater. Trans. A 25(7), 1509 (1994). doi:10.1007/BF02665483
J. Glazer, Int. Mater. Rev. 40, 65 (1995)
W.J. Plumbridge, C.R. Gagg, Proc. Inst. Mech. Engrs. Part L: J. Mater. Des. Appl. 214, 153 (2000)
T.B. Massalki, in Binary Alloys Phase Diagrams, (American Society of Metals, Materials Park (OH), 1990), p. 94
F. Ochoa, J.J. Williams, N. Chawla, J. Electron. Mater. 32, 1414 (2003). doi:10.1007/s11664-003-0109-z
F. Ochoa, J.J. Williams, N. Chawla, JOM 55, 56 (2003). doi:10.1007/s11837-003-0142-7
F. Guo, J.P. Lucas, K.N. Subramanian, J. Mater. Sci. Mater. Electron. 12, 27 (2001). doi:10.1023/A:1011264527894
I. Dutta, A. Gopinath, C. Marshall, J. Electron. Mater. 31, 253 (2002). doi:10.1007/s11664-002-0141-4
C.G. Kuo, S.M.L. Sastry, K.L. Jerina, Metall. Trans. A 26, 3265 (1995). doi:10.1007/BF02669454
J. Lee, K. Chu, D.Y. Jeon, R. Patzelt, D. Manessis, A. Ostmann, in Proceedings of 56th Electronic Components and Technology Conference, 30 May–2 June 2006, p. 244
P. Liu, F. Guo, 8th Conference on Electronics Packaging Technology (EPTC ‘06), 6–8 Dec 2006, p. 717
M. Mccormack, H.S. Chen, G.W. Kammlott, S. Jin, J. Electron. Mater. 26(8), 954 (1997). doi:10.1007/s11664-997-0281-7
F. Tai, F. Guo, Z.D. Xia, Y.P. Lei, Y.F. Yan, J.P. Liu et al., J. Electron. Mater. 34(11), 1357 (2005). doi:10.1007/s11664-005-0190-6
J. Shen, Y.C. Liu, Y.J. Han, Y.M. Tian, H.X. Gao, Mater. Sci. Eng. A 441, 135 (2006). doi:10.1016/j.msea.2006.08.006
H.T. Lee, Y.H. Lee, Mater. Sci. Eng. A 419, 172 (2006). doi:10.1016/j.msea.2005.12.021
Z.X. Wang, I. Dutta, B.S. Majumdar, Scr. Mater. 54, 627 (2006). doi:10.1016/j.scriptamat.2005.10.037
http://www.nanoamor.com/_nanoparticles. Accessed 5th March 2008
D.J. Lloyd, Int. Mater. Rev. 39, 1 (1994)
I.A. Ibrahim, F.A. Mohamed, E.J. Lavernia, J. Mater. Sci. 26, 1137 (1991). doi:10.1007/BF00544448
R. Roy, D.K. Agrawal, J. Cheng, US Patent 6,183,689 B1 (2001)
S. Leparoux, S. Vaucher, O. Beffort, Adv. Eng. Mater. 5, 449 (2003). doi:10.1002/adem.200320136
G. Sethi, A. Upadhyaya, D.K. Agrawal, Sci. Sin. 35, 49 (2003). doi:10.2298/SOS0302049S
M. Gupta, W.L.E. Wong, Scr. Mater. 52, 479 (2005). doi:10.1016/j.scriptamat.2004.11.006
W.L.E. Wong, S. Karthik, M. Gupta, Mater. Sci. Technol. 21, 1063 (2005). doi:10.1179/174328405X51758
S.S. Panda, V. Singh, A. Upadhyaya, D.K. Agrawal, Scr. Mater. 54, 2179 (2006). doi:10.1016/j.scriptamat.2006.02.034
A. Upadhyaya, G. Sethi, Scr. Mater. 54, 469 (2007). doi:10.1016/j.scriptamat.2006.11.031
W.L.E. Wong, M. Gupta, Compos. Sci. Technol. 67, 1541 (2007). doi:10.1016/j.compscitech.2006.07.015
K.S. Tun, M. Gupta, Compos. Sci. Technol. 67, 2657 (2007). doi:10.1016/j.compscitech.2007.03.006
K.S. Tun, M. Gupta. J. Alloy Compd. (2007). doi:10.1016/j.jallcom.2007.11.047
Y. Tomita, M. Tago, Y. Nemoto, K. Takahashi, Electron. Mater. Pack. EMAP 2001, 107 (2001)
P.H. Lawyer, D. Choudhury, M.D. Wetzel, D.B. Rensch, in 23rd IEEE/CPMT Electronics Manufacturing Technology Symposium, 19–21 October 1998, p. 390
B.C. Kim, J.H. Kim, J.H. Lee, C.D. Yoo, D.S. Choi, J. Kor. Weld. Soc. 22, 258 (2004)
J.M. Kim, J.P. Jung, Y.N. Zhou, J.Y. Kim, J. Electron. Mater. 37(3), 324 (2008). doi:10.1007/s11664-007-0341-z
R.A. Saravanan, M.K. Surappa, Mater. Sci. Eng. A 276, 108 (2000). doi:10.1016/S0921-5093(99)00498-0
H. Mavoori, S. Jin, J. Electron. Mater. 27(11), 1216 (1998). doi:10.1007/s11664-998-0072-9
X.L. Zhong, M. Gupta, Adv. Eng. Mater. 7(11), 1049 (2005). doi:10.1002/adem.200500109
S.M.L. Nai, J. Wei, M. Gupta, Thin Solid Films 504, 401 (2006). doi:10.1016/j.tsf.2005.09.057
S. Ugandhar, M. Gupta, S.K. Sinha, Compos. Struct. 72, 266 (2006). doi:10.1016/j.compstruct.2004.11.010
M.J. Tan, X. Zhang, Mater. Sci. Eng. A 244, 80 (1998). doi:10.1016/S0921-5093(97)00829-0
Z. Post, P. Ritt, IRE Trans. Compon. Parts 5(2), 81 (1958)
C.S. Goh, J. Wei, L.C. Lee, M. Gupta, Acta Mater. 55, 5115 (2007). doi:10.1016/j.actamat.2007.05.032
M.E. Alam, M. Gupta, Powder Metall. (2008). doi: 10.1179/174329008X284895
Ü. Cöcen, K. Önel, Compos. Sci. Technol. 62, 275 (2002). doi:10.1016/S0266-3538(01)00198-1
C. Tekmen, I. Ozdemir, Ü. Cöcen, K. Önel, Mater. Sci. Eng. A 360, 365 (2003). doi:10.1016/S0921-5093(03)00461-1
S.M.L. Nai, J. Wei, M. Gupta, J. Electron. Mater. 35(7), 1518 (2006). doi:10.1007/s11664-006-0142-9
S. Ugandhar, N. Srikanth, M. Gupta, S.K. Sinha, Adv. Eng. Mater. 6(12), 957 (2003)
Acknowledgments
The authors acknowledges the support received for this research work ref: C-534-000-003-414 from the Minerals, Metals and Materials Technology Centre (M3TC) of the National University of Singapore. Authors also wish to acknowledge Agency for Science, Technology and Research (A*STAR) for providing research scholarship.
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Babaghorbani, P., Nai, S.M.L. & Gupta, M. Development of lead-free Sn-3.5Ag/SnO2 nanocomposite solders. J Mater Sci: Mater Electron 20, 571–576 (2009). https://doi.org/10.1007/s10854-008-9767-1
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DOI: https://doi.org/10.1007/s10854-008-9767-1