Abstract
This paper discusses the effect of forming gas (93%N2 + 7%H2) plasma treatment for sol-gel methyl-silsesquioxane (MSQ) as a dielectric film towards the grain morphology of a solution processable pentacene. Atomic force microscopy and X-ray diffractometer results confirm that a brief (10 s) plasma treatment for MSQ increases the grain size of pentacene and encourages its growth in thin-film phase. This paper also demonstrates that the presence of large Si(CH3)3 bonds on the MSQ surface are very important to encourage the growth of pentacene’s molecules in thin-film phase. In addition, this paper also suggests that there is no strong relationship between the grain size and ordering of pentacene molecules.
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Acknowledgement
This work was performed with the support of The University of Auckland staff’s research fund no. 3607226/9274 and HEEP fund from AsiaNZ Foundation. The authors would like to thank Dr. Alec Asadov for XRD support; Dr. B. James of Research Centre for Surface and Material Science (RCSMS), University of Auckland for XPS support and lastly Dr. Z.W. Li for plasma treatment support.
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Aw, K.C., Tjitra Salim, N., Lohani, A. et al. Effect of plasma treated sol-gel dielectric towards the morphology of pentacene. J Mater Sci: Mater Electron 19, 1247–1251 (2008). https://doi.org/10.1007/s10854-008-9580-x
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DOI: https://doi.org/10.1007/s10854-008-9580-x