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Structural, optical and electrical characterization of undoped ZnMgO film grown by spray pyrolysis method

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Abstract

Undoped Zn1−X Mg X O poly crystalline films were successfully grown by a spray pyrolysis method at 500 °C. The samples indicated high quality because (0002) orientation was strongly observed in the X-ray diffraction (XRD) pattern below Mg content X = 0.3. A lattice constant of c axis decreased linearly with increasing Mg content, indicating that the lattice constant of c axis followed Vegard’s law. It was deduced that Mg atoms could be successfully substituted in Zn site from lattice constants and optical bandgap.

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Acknowledgment

This work was in part supported by The SANEYOSHI SCHOLARSHIP FOUNDATION.

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Authors and Affiliations

  1. Department of Electrical and Electronic Engineering, University of Miyazaki, 1-1 Gakuen Kibanadai-nishi, Miyazaki, 889-2192, Japan

    K. Yoshino & S. Oyama

  2. Department of Applied Physics, Okayama University of Science, 1-1 Ridai-cho, Okayama, 700-0005, Japan

    M. Yoneta

Authors
  1. K. Yoshino
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  2. S. Oyama
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  3. M. Yoneta
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Correspondence to K. Yoshino.

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Yoshino, K., Oyama, S. & Yoneta, M. Structural, optical and electrical characterization of undoped ZnMgO film grown by spray pyrolysis method. J Mater Sci: Mater Electron 19, 203–209 (2008). https://doi.org/10.1007/s10854-007-9333-2

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