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Properties of brush plated CdS films

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Abstract

Cadmium sulphide (CdS) thin films were deposited for the first time using the brush plating technique from the precursors on titanium and conducting glass substrates. The films were polycrystalline possessing single-phase hexagonal structure. Surface morphological studies indicated increase of grain size with increase of post deposition temperature. Optical band gap of 2.39 eV was obtained. XPS studies indicated the formation of CdS. Photo electrochemical cell studies indicated higher current and voltages compared to earlier reports on thin film electrodes. Mott–Schottky studies exhibited n-type behaviour with a carrier density of 1018 cm−3. Spectral response measurements indicated a quantum efficiency of 0.35.

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Authors and Affiliations

  1. Electrochemical Materials Science Division, Central Electrochemical Research Institute, Karaikudi, 630 006, India

    K. R. Murali

  2. Department of Physics, Saranathan College of Engineering, Trichy, India

    S. Kumaresan

  3. Department of Physics, Bharathidasan School of Engineering and Technology, Trichy, India

    J. Joseph Prince

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  1. K. R. Murali
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  2. S. Kumaresan
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  3. J. Joseph Prince
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Correspondence to K. R. Murali.

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Murali, K.R., Kumaresan, S. & Prince, J.J. Properties of brush plated CdS films. J Mater Sci: Mater Electron 18, 487–493 (2007). https://doi.org/10.1007/s10854-006-9064-9

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  • DOI: https://doi.org/10.1007/s10854-006-9064-9

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