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Structural and optical properties of CuIn0.35Al0.65Se2 thin films

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Abstract

CuIn0.35Al0.65Se2 thin films were deposited onto glass substrates by flash evaporation method. The films deposited at substrate temperatures 613–633 K were nearly stoichiometric, polycrystalline and single phase showing chalcopyrite structure with lattice parameters a = 0.569 nm and c = 1.124 nm. The optical absorption studies revealed a threefold optical structure near the fundamental edge with E g1 = 1.75 eV, E g2 = 1.81 eV and E g3 = 1.99 eV. The crystal-field (ΔCF) and spin–orbit (ΔSO) splitting parameters were evaluated.

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Acknowledgements

We are very much thankful to Defense Research and Development Organization, New Delhi, India for financial assistance through research project to carry out this research work.

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Authors and Affiliations

  1. Thin Film Laboratory, Department of Physics, Vellore Institute of Technology, Vellore, 632 014, India

    K. Srinivas, J. N. Kumar & G. H. Chandra

  2. Thin Film Laboratory, Department of Physics, Sri Venkateswara University, Tirupati, 517 502, India

    S. Uthanna

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  1. K. Srinivas
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  2. J. N. Kumar
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Correspondence to G. H. Chandra.

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Srinivas, K., N. Kumar, J., H. Chandra, G. et al. Structural and optical properties of CuIn0.35Al0.65Se2 thin films. J Mater Sci: Mater Electron 17, 1035–1039 (2006). https://doi.org/10.1007/s10854-006-9033-3

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