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Characteristics of pulse plated ZnTe films

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Abstract

Stoichiometric films of ZnTe are electrodeposited on stainless steel and conducting glass substrates from an aqueous solution consisting of ZnSO4 (50 mM), TeO2 (17 μM) and H2SO4 to maintain a pH of 2.5. Structure, morphology, composition, and optical are studied using XRD, SEM, EDAX and optical transmittance spectroscopy The films are composed of small crystallites (50 nm) with cubic crystal structure. The films were polycrystalline in nature with peaks corresponding to the cubic phase. Direct band gap of 2.30 eV was observed. XPS studiers indicated the formation of ZnTe. EDAX measurements were made on the films and it was found that there was a slight excess of Te. AFM studies indicated a surface roughness of 15 nm and a crystallite size of 10–50 nm.

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  1. Electrochemical Materials Science Division, Central Electrochemical research Institute, Karaikudi, 630 006

    K. R. Murali & P. Richards Rajkumar

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  1. K. R. Murali
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  2. P. Richards Rajkumar
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Murali, K.R., Rajkumar, P.R. Characteristics of pulse plated ZnTe films. J Mater Sci: Mater Electron 17, 393–396 (2006). https://doi.org/10.1007/s10854-006-7476-1

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  • DOI: https://doi.org/10.1007/s10854-006-7476-1

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