Abstract
We have investigated the fabrication and luminescent properties of different polymorphs of erbium (Er) silicate in Er-doped silicon oxide films. Silicon oxide films embedded with y-Er2Si2O7 and α-Er2Si2O7 layers have been fabricated with annealing at 1100 °C and 1150 °C, respectively. We demonstrate that y-Er2Si2O7 shows a stronger photoluminescence (PL) intensity, a longer PL lifetime, and a weaker PL thermal quenching effect than α-Er2Si2O7 due to the larger density of optically active Er ions, larger Er–Er average distance, higher symmetry, and stronger Er-O bonding. The Er lifetime–density product of y-Er2Si2O7 is as high as 3.5 × 1018 s cm−3 and is at least 2.4 times as large as that of α-Er2Si2O7 making y-Er2Si2O7 an excellent candidate for high optical gain.
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This work is supported by National Key R&D Program of China (2018YFB220025) and Natural Science Foundation of China (Nos. 61874095 and 61721005).
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Gao, Y., Fu, Q., Shen, H. et al. Correlation of efficient luminescence with crystal structures of y-Er2Si2O7 and α-Er2Si2O7 in Er-doped silicon oxide films. J Mater Sci 54, 12668–12675 (2019). https://doi.org/10.1007/s10853-019-03783-3
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DOI: https://doi.org/10.1007/s10853-019-03783-3