Abstract
When subjected to electron-beam irradiation in a transmission electron microscope, the grain boundary in an α-Al2O3 bicrystal is observed to migrate even at room temperature. The bicrystal is composed of grains with the same normal direction, and thus the difference in strain energy or surface energy between the two grains cannot explain the observed migration. We attribute this phenomenon to an increase in grain boundary mobility by electron-beam irradiation, especially by radiolysis effects.
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References
Sutton AP, Balluffi RW (1995) Interfaces in crystalline materials. Clarendon Press, Oxford
Wolf D, Yip S (eds) (1992) Materials interfaces: atomic-level structure and properties. Chapman & Hall, London
Gleiter H, Chalmers B (1972) High-angle grain boundaries. Pergamon, Oxford, pp 127–178
Wong CC, Smith HI, Thompson CV (1985) Surface-energy driven secondary grain growth in thin Au films. Appl Phys Lett 48:335–337
Palmer JE, Thompson CV, Smith HI (1987) Grain growth and grain size distributions in thin germanium films. J Appl Phys 62:2492–2497
Detavernier C, Deduytsche D, van Meirhaeghe RL, de Baerdemaeker J, Dauwe C (2003) Appl Phys Lett 82:1863–1865
Zielinski EM, Vinci RP, Bravman JC (1994) Effects of barrier layer and annealing on abnormal grain growth in copper thin films. J Appl Phys 76:4516–4523
Simões S, Calinas R, Vieira MT, Vieira MF, Ferreira PJ (2010) In situ TEM study of grain growth in nanocrystalline copper thin films. Nanotechnology 21:145701–1–145701-12
Egerton RF, Li P, Malac M (2004) Radiation damage in the TEM and SEM. Micron 35:399–409
Williams DB, Carter CB (1996) Transmission electron microscopy. Plenum, New York, pp 49–65
Egerton RF, McLeod R, Wang F, Malac M (2010) Basic questions related to electron-induced sputtering in the TEM. Ultramicroscopy 110:991–997
Cazaux J (1995) Correlations between ionization radiation damage and charging effects in transmission electron microscopy. Ultramicroscopy 60:411–425
Jiang N, Silcox J (2002) Electron irradiation induced phase decomposition in alkaline earth multi-component oxide glass. J Appl Phys 92:2310–2316
Humphreys J, Bullough TJ, Devenish RW, Maher DM, Turner PS (1990) Electron beam nano-etching in oxides, fluorides, metals and semiconductors. Scanning Microsc Suppl 4:185–192
Hobbs LW (1979) Radiation effects in analysis of inorganic specimens by TEM. In: Hren JJ, Goldstein JI, Joy DC (eds) Introduction to analytical electron microscopy. Plenum, New York, pp 437–480
Knotek ML, Feibelman PJ (1978) Ion desorption by core-hole Auger decay. Phys Rev Lett 40:964–967
Feibelman PJ, Knotek ML (1978) Reinterpretation of electron-stimulated desorption data from chemisorption systems. Phys Rev B 18:6531–6539
Pells GP, Philips DC (1979) Radiation damage of α-Al2O3 in the HVEM. J Nucl Mater 80:207–214
Acknowledgements
This research was supported by the Basic Science Research Program through the National Research Foundation of Korea funded by the Ministry of Education (2016R1D1A1A09916302) (RIAM) and by the Engineering Research Center (ERC) program of the National Research Foundation of Korea funded by the Ministry of Science and ICT (2015R1A5A1037627).
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Lee, S.B., Lee, SY., Kim, M. et al. Increased mobility of an α-Al2O3 grain boundary by electron-beam irradiation. J Mater Sci 53, 2383–2388 (2018). https://doi.org/10.1007/s10853-017-1688-z
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DOI: https://doi.org/10.1007/s10853-017-1688-z