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Comparison of residual stress determination using different crystal planes by short-wavelength X-ray diffraction in a friction-stir-welded aluminum alloy plate

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Abstract

A friction-stir-welded (FSW) AA7050-T7451 pre-stretched plate was investigated nondestructively using the short-wavelength X-ray diffraction method to study the distribution of internal residual stress. During the investigation, anomalous deviation of the diffraction peak with crystal plane Al (111) was observed causing large testing errors. The relationship between texture of the material and the anomalous deviation peaks of (111), (200) and (311) and the method to eliminate their effect on residual stress determination were investigated. In addition, the comparison of the average d 0 method and the in situ d 0 method was performed using the three crystal planes to solve the problem caused by gradient in weld structure. Results showed that the anomalous deviations of different crystal planes were different from each other in the directions deflected from the maximum pole density direction. The method of residual stress determination performed in the directions of maximum pole density proved to be helpful to reduce the effect of anomalous deviations. The values and profiles of the residual stress tested by this method using (111), (200) and (311) were identical. The results suggest that in situ d 0 method could be used to eliminate the influence of the difference in lattice spacing among different areas of the FSW plate. The errors of residual stress determination decreased with the increase in the diffracting plane crystal indices.

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Acknowledgements

This work is supported by the National Natural Science Foundation of China (Grant No. 51275037), the National Key R&D Plan (Grant No. 2016YFB0301105) and the Fundamental Research Funds for the Central Universities (Grant No. FRF-TP-16-016A1).

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Authors and Affiliations

  1. Institute for Advanced Materials and Technology, University of Science and Technology Beijing, Beijing, 100083, China

    Pengfei Ji, Jin Zhang, Xiaoming Cui & Yong Lian

  2. Southwest Technology and Engineering Research Institute, Chongqing, 400039, China

    Lin Zheng, Yong Xiao & Shitao Dou

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  1. Pengfei Ji
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  2. Jin Zhang
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Correspondence to Jin Zhang.

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Ji, P., Zhang, J., Zheng, L. et al. Comparison of residual stress determination using different crystal planes by short-wavelength X-ray diffraction in a friction-stir-welded aluminum alloy plate. J Mater Sci 52, 12834–12847 (2017). https://doi.org/10.1007/s10853-017-1321-1

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