Abstract
Lead-free (1 − x)NaNbO3/xBa(Ti0.5Sn0.5)O3 (x = 0.1, 0.125, 0.15, 0.175, 0.2, and 0.3) ceramics were elaborated by the conventional ceramic technique. Sintering has been made at 1523 K for 2 h. The crystal structure was investigated by X-ray diffraction with CuKα radiation at room temperature. As a function of composition, these compounds crystallize with tetragonal or cubic symmetry. Dielectric measurements show that the materials have a classical ferroelectric behavior for compositions in the range 0.10 ≤ x ≤ 0.15 and relaxor one for compositions in the range 0.15 < x ≤ 0.30. Temperatures T C or T m decrease as x content increases. The ferroelectric behavior has been confirmed by hysteresis characterization. For x = 0.1, a piezoelectric coefficient d 31 of 42.146 pC N−1 was obtained at room temperature. The evolution of the Raman spectra was studied as a function of temperature for x = 0.1.
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Khelifi, H., Aydi, A., Abdelmoula, N. et al. Structural and dielectric properties of Na1−x Ba x Nb1−x (Sn0.5Ti0.5) x O3 ceramics. J Mater Sci 47, 1943–1949 (2012). https://doi.org/10.1007/s10853-011-5987-5
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DOI: https://doi.org/10.1007/s10853-011-5987-5