Abstract
Textured cerium zirconate (Ce x Zr1−x O2) films were deposited on biaxially textured Ni-5at.%W substrate by direct-current (dc) reactive magnetron sputtering for low cost production of high performance YBa2Cu3O7−δ (YBCO) coated conductors. Film composition was controlled by modulating dc power applied to the Ce metal target. X-ray diffraction analysis shows that all the samples exhibit epitaxial growth, with c-axis perpendicular to the substrate surface. The YBCO film deposited directly on the Ce0.32Zr0.68O2 layer for optimized lattice matching shows a transition temperature T c and critical current density J c (75.5 K, self field) of 90.4 K and 1.3 MA/cm2. The in-field dependence of J c is similar to the standard CeO2/YSZ/CeO2 buffered samples. These results demonstrate that a single Ce x Zr1−x O2 buffer layer, instead of CeO2/YSZ/CeO2 multi-buffer layers for the fabrication of YBCO coated conductors, provides advantages such as simplified architecture and potentially reduced cost due to the reduced fabrication steps.
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Acknowledgements
The authors are grateful to Professor Q.X.Jia (Los Alamos National Laboratory) for fruitful discussion and to D.M. Feldman (Los Alamos National Laboratory) for assistance with superconducting property measurements. We gratefully acknowledge the support of the National Science Foundation of China under Grant Nos. 50902017 and the New Teacher Foundation of Doctoral Points of Education Ministry of China (Grant Nos. 200806141023) for this study.
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Xiong, J., Qin, W., Yu, M. et al. Single cerium zirconate buffer layer on biaxially textured metal substrates for high performance coated conductors. J Mater Sci 46, 238–242 (2011). https://doi.org/10.1007/s10853-010-4952-z
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DOI: https://doi.org/10.1007/s10853-010-4952-z