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A non-destructive method for thickness measurement of thin electrospun membranes using white light profilometry

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Authors and Affiliations

  1. School of Fashion and Textiles, RMIT University, 25 Dawson Street, Brunswick, VIC, 3056, Australia

    Nor Dalila Nor Affandi, Rajiv Padhye & Lyndon Arnold

  2. Division of Materials Science and Engineering, CSIRO, Private Bag 10, Clayton South MDC, VIC, 3169, Australia

    Nor Dalila Nor Affandi, Yen Bach Truong & Ilias Louis Kyratzis

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  1. Nor Dalila Nor Affandi
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  2. Yen Bach Truong
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  3. Ilias Louis Kyratzis
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  4. Rajiv Padhye
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  5. Lyndon Arnold
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Correspondence to Yen Bach Truong.

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Affandi, N.D.N., Truong, Y.B., Kyratzis, I.L. et al. A non-destructive method for thickness measurement of thin electrospun membranes using white light profilometry. J Mater Sci 45, 1411–1418 (2010). https://doi.org/10.1007/s10853-009-4103-6

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  • DOI: https://doi.org/10.1007/s10853-009-4103-6

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