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Spectral and directional emittance of alumina at 823 K

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Abstract

Spectral–directional emittance measurements of aluminum oxide (99.5% pure), in air, were performed at 823 K using an apparatus comprised of a Fourier Transform Infrared (FTIR) spectrometer, a blackbody radiating cavity (hohlraum), and a sample holder which allows directional measurements. The data cover a wide spectral range between 2 and 25 μm, and a directional range from a surface normal to a 72° polar angle. The aluminum oxide sample used in the experiment had a nominal surface roughness of 1 μm determined by a profilometer. Directional emittance shows no departure from dielectric behavior.

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Authors and Affiliations

  1. 275 Wilmore Laboratory, Materials Engineering Program, Auburn University, Auburn, AL, 36849-5341, USA

    George Teodorescu

  2. 270 Ross Hall, Mechanical Engineering Department, Auburn University, Auburn, AL, 36849-5341, USA

    Peter D. Jones

Authors
  1. George Teodorescu
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  2. Peter D. Jones
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Correspondence to George Teodorescu.

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Teodorescu, G., Jones, P.D. Spectral and directional emittance of alumina at 823 K. J Mater Sci 43, 7225–7229 (2008). https://doi.org/10.1007/s10853-008-2945-y

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  • DOI: https://doi.org/10.1007/s10853-008-2945-y

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