Estimation of lattice strain in nanocrystalline silver from X-ray diffraction line broadening

Abstract

The lattice strain contribution to the X-ray diffraction line broadening in nanocrystalline silver samples with an average crystallite size of about 50 nm is studied using Williamson-Hall analysis assuming uniform deformation, uniform deformation stress and uniform deformation energy density models. It is observed that the anisotropy of the crystallite should be taken into account, while separating the strain and particle size contributions to line broadening. Uniform deformation energy density model is found to model the lattice strain appropriately. The lattice strain estimated from the interplanar spacing data are compared with that estimated using uniform-energy density model. The lattice strain in nanocrystalline silver seems to have contributions from dislocations over and above the contribution from excess volume of grain boundaries associated with vacancies and vacancy clusters.