The above article was submitted and published in JMSL 20 (2001) 969 with an unintentional mistake: Fig. 5 is incorrect. The correct figure is reproduced below with a modified caption. The author apologises for any inconvenience or embarrassment caused.

Fig. 5
figure 1

Atomic Force microscopy images of Fe2Ta2O8 thin films deposited on Si (100) annealed at (a) 600°C/5 h, (b) 700°C/5 h and (c) 800°C/5 h