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Non-destructive analysis of silver selenide films obtained by Pulsed Laser Deposition (PLD) with Micro-XRF

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Abstract

Thin films of silver selenide with varying composition have been deposited on magnesium oxide substrates with pulsed laser deposition and were investigated via micro-XRF. A calibration procedure was designed to determine the absolute thicknesses of the films. The lateral homogeneity was investigated by elemental mapping, thus delivering information about the deposition process. Wet chemical analysis was performed on the dissolved layers with ICP-OES and ICP-MS to determine the stoichiometry of the Ag x Se y . The results suggest a correlation between the composition of the layers and their thicknesses by showing a silver enrichment for thinner layers.

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Authors and Affiliations

  1. Department of Analytical Chemistry, Institute for Inorganic Chemistry, University of Hannover, Callinstr. 9, 30167, Hannover, Germany

    Rainer Dargel, Mohamed Azeroual & Carla Vogt

  2. Institute of Physical Chemistry, University of Giessen, Heinrich-Buff-Ring 58, 35392, Giessen, Germany

    Boris Mogwitz & Juergen Janek

Authors
  1. Rainer Dargel
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  2. Mohamed Azeroual
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  3. Boris Mogwitz
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  4. Juergen Janek
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  5. Carla Vogt
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Corresponding author

Correspondence to Carla Vogt.

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Dargel, R., Azeroual, M., Mogwitz, B. et al. Non-destructive analysis of silver selenide films obtained by Pulsed Laser Deposition (PLD) with Micro-XRF. J Mater Sci 42, 7375–7380 (2007). https://doi.org/10.1007/s10853-006-1310-2

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  • DOI: https://doi.org/10.1007/s10853-006-1310-2

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