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Effect of oxygen vacancies on nonlinear dielectric properties of SrTiO3 thin films

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Authors and Affiliations

  1. The National Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science & Technology of China, Jianshe Road, Chengdu, 610054, China

    X. Z. Liu, B. W. Tao & Y. R. Li

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  1. X. Z. Liu
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  2. B. W. Tao
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  3. Y. R. Li
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Correspondence to B. W. Tao.

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Liu, X.Z., Tao, B.W. & Li, Y.R. Effect of oxygen vacancies on nonlinear dielectric properties of SrTiO3 thin films. J Mater Sci 42, 389–392 (2007). https://doi.org/10.1007/s10853-006-1088-2

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  • DOI: https://doi.org/10.1007/s10853-006-1088-2

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