Abstract
Experiments were conducted on electrodeposited (ED) nanocrystalline (nc) Ni with an average initial grain size of about 20 nm at 393 K to study the shape of the creep curves. In addition, microstructure was examined by means of transmission electron microscopy (TEM). The results show that the creep curves are characterized by the presence of a well-defined steady-state stage. An examination of the microstructure indicates that while grain growth occurs during deformation, the grain size attains a constant value once steady state creep is approached. A comparison between grain size measurements obtained by the TEM technique and those obtained via the X-ray diffraction method shows that the use of the latter method may lead to an underestimation of the value of the average grain size.
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Acknowledgements
This work was supported by National Science Foundation under Grant number DMR-0304629. Thanks are extended to Dr. Wen-An Chiou, Indranil Roy, and Li-Chung Lai for their assistance in some of the TEM work.
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Chauhan, M., Mohamed, F.A. Microstructural evolution of bulk nanocrystalline Ni during creep. J Mater Sci 42, 1606–1614 (2007). https://doi.org/10.1007/s10853-006-0823-z
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DOI: https://doi.org/10.1007/s10853-006-0823-z