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Electron microscope weak-beam imaging of stacking fault tetrahedra: observations and simulations

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Abstract

Weak-beam diffraction-contrast electron microscope images of stacking-fault tetrahedra (SFT) have been simulated by solving numerically the Howie–Basinski equations, which are well suited for studying the dependence of image contrast on experimental parameters. These simulated images are in good qualitative agreement with experimental transmission electron micrographs. The visibility of small SFT and the relationship between measured image sizes and real SFT sizes are discussed.

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Notes

  1. Some experimental images are for Au. In practice images are dominated by stacking-fault contrast which will not vary much from material to material, and so it was not thought worthwhile to repeat the simulations for Au which, being in the same column in the periodic table, is similar in many respects to Cu and Ag.

  2. Normalisation of simulated images is of course an issue. In Fig. 2 and elsewhere there is no change in normalisation from one simulation to another. Generally we regard the contrast as very low if the maximum image intensity relative to background, y = Imax/Ibackground is less than 3. If 3 < y < 10 we consider that visibility is low, but the defect is likely to be detected. For a discussion see ref [4].

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Acknowledgements

ZZ is grateful to the EURATOM/UKAEA Fusion Association for the provision of a studentship.

He is also grateful to St Hugh’s College for the award of a Wei Lun Scholarship. Work at UKAEA

was funded by EPSRC and EURATOM.

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Authors and Affiliations

  1. Department of Materials, University of Oxford, Parks Rd., Oxford, OX1 3PH, UK

    M. L. Jenkins & Z. Zhou

  2. EURATOM/UKAEA Fusion Association, Culham Science Centre, Oxfordshire, OX14 3DB, UK

    S. L. Dudarev

  3. Department of Physics, Imperial College, Prince Consort Rd., London, SW7 2BZ, UK

    A. P. Sutton

  4. Materials Science Division, Argonne National Laboratory, Argonne, IL, 60439, USA

    M. A. Kirk

Authors
  1. M. L. Jenkins
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  2. Z. Zhou
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  3. S. L. Dudarev
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  4. A. P. Sutton
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  5. M. A. Kirk
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Correspondence to M. L. Jenkins.

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Jenkins, M.L., Zhou, Z., Dudarev, S.L. et al. Electron microscope weak-beam imaging of stacking fault tetrahedra: observations and simulations. J Mater Sci 41, 4445–4453 (2006). https://doi.org/10.1007/s10853-006-0089-5

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  • DOI: https://doi.org/10.1007/s10853-006-0089-5

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