Journal of Electronic Testing

, Volume 30, Issue 1, pp 9–23 | Cite as

Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges Ahead

  • Ujjwal Guin
  • Daniel DiMase
  • Mohammad TehranipoorEmail author


The counterfeiting of electronic components has become a major challenge in the 21st century. The electronic component supply chain has been greatly affected by widespread counterfeit incidents. A specialized service of testing, detection, and avoidance must be created to tackle the worldwide outbreak of counterfeit integrated circuits (ICs). So far, there are standards and programs in place for outlining the testing, documenting, and reporting procedures. However, there is not yet enough research addressing the detection and avoidance of such counterfeit parts. In this paper we will present, in detail, all types of counterfeits, the defects present in them, and their detection methods. We will then describe the challenges to implementing these test methods and to their effectiveness. We will present several anti-counterfeit measures to prevent this widespread counterfeiting, and we also consider the effectiveness and limitations of these anti-counterfeiting techniques.


Counterfeit ICs Counterfeit detection and avoidance Electronic component supply chain 



This work was supported in part by the National Science Foundation under grant CNS 1344271, Missile Defense Agency, and Honeywell. The authors would like to thank Steve Walters of Honeywell, and the G-19A group members for providing valuable feedback on the defect taxonomy.


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Copyright information

© Springer Science+Business Media New York 2014

Authors and Affiliations

  • Ujjwal Guin
    • 1
  • Daniel DiMase
    • 2
  • Mohammad Tehranipoor
    • 1
    Email author
  1. 1.ECE DepartmentUniversity of ConnecticutStorrsUSA
  2. 2.Honeywell Inc.MorristownUSA

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